Digitale Bibliotheek
Sluiten Bladeren door artikelen uit een tijdschrift
     Tijdschrift beschrijving
       Alle jaargangen van het bijbehorende tijdschrift
         Alle afleveringen van het bijbehorende jaargang
                                       Alle artikelen van de bijbehorende aflevering
 
                             22 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 CurrentVoltage Characteristics of Two-Electrode Elements with Carbon Nanotubes I. I. Bobrinetskii
2003
32 2 p. 79-81
3 p.
artikel
2 Current–Voltage Characteristics of Two-Electrode Elements with Carbon Nanotubes Bobrinetskii, I. I.
2003
32 2 p. 79-81
artikel
3 Electrochemical Etching of a Niobium Film through a Thin Nanomask Formed by AFM Tip-Induced Local Oxidation A. N. Red'kin
2003
32 2 p. 88-90
3 p.
artikel
4 Electrochemical Etching of a Niobium Film through a Thin Nanomask Formed by AFM Tip-Induced Local Oxidation Red'kin, A. N.
2003
32 2 p. 88-90
artikel
5 High-Permittivity-Insulator EEPROM Cell Using Al2O3 or ZrO2 V. A. Gritsenko
2003
32 2 p. 69-74
6 p.
artikel
6 High-Permittivity-Insulator EEPROM Cell Using Al2O3 or ZrO2 Gritsenko, V. A.
2003
32 2 p. 69-74
artikel
7 Impulse-Current Generation by the Bispin: Factors Determining the Peak Current A. P. Lysenko
2003
32 2 p. 82-87
6 p.
artikel
8 Impulse-Current Generation by the Bispin: Factors Determining the Peak Current Lysenko, A. P.
2003
32 2 p. 82-87
artikel
9 InxGa1 xAs Strained-Layer Quantum Well in a Pseudomorphic Heterostructure: High-Resolution XRD Characterization for Different Quantum-Well Thicknesses A. M. Afanas'ev
2003
32 2 p. 63-68
6 p.
artikel
10 InxGa 1–xAs Strained-Layer Quantum Well in a Pseudomorphic Heterostructure: High-Resolution XRD Characterization for Different Quantum-Well Thicknesses Afanas'ev, A. M.
2003
32 2 p. 63-68
artikel
11 Multilevel-Injection Characterization of Positive-Charge Generation and Relaxation in MOS Oxide V. V. Andreev
2003
32 2 p. 119-124
6 p.
artikel
12 Multilevel-Injection Characterization of Positive-Charge Generation and Relaxation in MOS Oxide Andreev, V. V.
2003
32 2 p. 119-124
artikel
13 NANODEV: A Nanoelectronic-Device Simulation Software System I. I. Abramov
2003
32 2 p. 97-104
8 p.
artikel
14 NANODEV: A Nanoelectronic-Device Simulation Software System Abramov, I. I.
2003
32 2 p. 97-104
artikel
15 Planar Power MOSFETs for Smart Power CMOS Switches M. A. Korolev
2003
32 2 p. 75-78
4 p.
artikel
16 Planar Power MOSFETs for Smart Power CMOS Switches Korolev, M. A.
2003
32 2 p. 75-78
artikel
17 Prediction of Local and Global Ionization Effects on ICs: The Synergy between Numerical and Physical Simulation V. V. Belyakov
2003
32 2 p. 105-118
14 p.
artikel
18 Prediction of Local and Global Ionization Effects on ICs: The Synergy between Numerical and Physical Simulation Belyakov, V. V.
2003
32 2 p. 105-118
artikel
19 Surface-Photovoltage Measurement of Volume Electron Lifetime in p-Si Wafers V. A. Skidanov
2003
32 2 p. 91-95
5 p.
artikel
20 Surface-Photovoltage Measurement of Volume Electron Lifetime in p-Si Wafers Skidanov, V. A.
2003
32 2 p. 91-95
artikel
21 Temperature Dependence of Carrier Generation at the SiliconLead-Borosilicate-Glass Interface S. I. Vlasov
2003
32 2 p. 95-96
2 p.
artikel
22 Temperature Dependence of Carrier Generation at the Silicon–Lead-Borosilicate-Glass Interface Vlasov, S. I.
2003
32 2 p. 95-96
artikel
                             22 gevonden resultaten
 
 Koninklijke Bibliotheek - Nationale Bibliotheek van Nederland