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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
16 results found
no
title
author
magazine
year
volume
issue
page(s)
type
1
Digital-Reflectometry Characterization of the Surface Structure and Protective Property of Thin Films
V. A. Kotenev
2002
31
6
p. 396-406
11 p.
article
2
Digital-Reflectometry Characterization of the Surface Structure and Protective Property of Thin Films
Kotenev, V. A.
2002
31
6
p. 396-406
article
3
Helicon Plasma Source
O. V. Braginskii
2002
31
6
p. 341-345
5 p.
article
4
Helicon Plasma Source
Braginskii, O. V.
2002
31
6
p. 341-345
article
5
Microelectromechanical System for Controlling Flow Past an Airfoil: Pressure Transducers
A. A. Taskin
2002
31
6
p. 359-365
7 p.
article
6
Microelectromechanical System for Controlling Flow Past an Airfoil: Pressure Transducers
Taskin, A. A.
2002
31
6
p. 359-365
article
7
Mid- and Long-Wave IR Detectors Using an Hg1 xCdxTe Heteroepitaxial Layer
V. V. Vasilyev
2002
31
6
p. 351-358
8 p.
article
8
Mid- and Long-Wave IR Detectors Using an Hg1 – xCdxTe Heteroepitaxial Layer
Vasilyev, V. V.
2002
31
6
p. 351-358
article
9
Modeling the High-Voltage Gas-Discharge-Plasma Etching of SiO2
V. A. Kolpakov
2002
31
6
p. 366-374
9 p.
article
10
Modeling the High-Voltage Gas-Discharge-Plasma Etching of SiO2
Kolpakov, V. A.
2002
31
6
p. 366-374
article
11
Non-Archimedean Calculus in the Mathematical Modeling of Digital ICs
E. G. Shcheglov
2002
31
6
p. 384-395
12 p.
article
12
Non-Archimedean Calculus in the Mathematical Modeling of Digital ICs
Shcheglov, E. G.
2002
31
6
p. 384-395
article
13
Predicting the Effect of Pulsed Ionizing Radiation on Operational Amplifiers
T. M. Agakhanyan
2002
31
6
p. 375-383
9 p.
article
14
Predicting the Effect of Pulsed Ionizing Radiation on Operational Amplifiers
Agakhanyan, T. M.
2002
31
6
p. 375-383
article
15
X-ray and UV Adjustment of Threshold Voltage in MOS-Circuit Manufacture
M. N. Levin
2002
31
6
p. 346-350
5 p.
article
16
X-ray and UV Adjustment of Threshold Voltage in MOS-Circuit Manufacture
Levin, M. N.
2002
31
6
p. 346-350
article
16 results found
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