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                             24 results found
no title author magazine year volume issue page(s) type
1 Double-Junction Schottky Diodes Using a Ti/Si/Al Structure D. A. Andreev
2002
31 2 p. 122-125
4 p.
article
2 Double-Junction Schottky Diodes Using a Ti/Si/Al Structure Andreev, D. A.
2002
31 2 p. 122-125
article
3 Ellipsometric Characterization of the Transition Layer in SiC/AlN Structures V. V. Luchinin
2002
31 2 p. 110-115
6 p.
article
4 Ellipsometric Characterization of the Transition Layer in SiC/AlN Structures Luchinin, V. V.
2002
31 2 p. 110-115
article
5 Evolution of Dopant Concentration from a Gaussian Profile in a Nonuniform Temperature Field V. I. Rudakov
2002
31 2 p. 97-102
6 p.
article
6 Evolution of Dopant Concentration from a Gaussian Profile in a Nonuniform Temperature Field Rudakov, V. I.
2002
31 2 p. 97-102
article
7 In Celebration of the 70th Birthday of Igor G. Neizvestny 2002
31 2 p. 69-69
1 p.
article
8 In Celebration of the 70th Birthday of Igor G. Neizvestny 2002
31 2 p. 69
article
9 Local Ellipsometric Inspection of Small Windows E. S. Lonskii
2002
31 2 p. 126-129
4 p.
article
10 Local Ellipsometric Inspection of Small Windows Lonskii, E. S.
2002
31 2 p. 126-129
article
11 Model and Logic Gates for Quantum Computing with a Two-Level System in a Resonant-Frequency Field A. L. Danilyuk
2002
31 2 p. 116-121
6 p.
article
12 Model and Logic Gates for Quantum Computing with a Two-Level System in a Resonant-Frequency Field Danilyuk, A. L.
2002
31 2 p. 116-121
article
13 Porous-Silicon Formation in HFHNO3H2O Etchants E. A. Starostina
2002
31 2 p. 88-96
9 p.
article
14 Porous-Silicon Formation in HF–HNO3–H2O Etchants Starostina, E. A.
2002
31 2 p. 88-96
article
15 Solid-Phase Reactions in the Thermal Oxidation of Ni/GaAs Heterostructures I. Ya. Mittova
2002
31 2 p. 84-87
4 p.
article
16 Solid-Phase Reactions in the Thermal Oxidation of Ni/GaAs Heterostructures Mittova, I. Ya.
2002
31 2 p. 84-87
article
17 Statistical Process Control in IC Manufacture: A Technique for Small-Batch, Intermittent Production K. K. Doroshevich
2002
31 2 p. 130-136
7 p.
article
18 Statistical Process Control in IC Manufacture: A Technique for Small-Batch, Intermittent Production Doroshevich, K. K.
2002
31 2 p. 130-136
article
19 Thermal Oxidation of InP Promoted by the Formation of N2O I. Ya. Mittova
2002
31 2 p. 79-83
5 p.
article
20 Thermal Oxidation of InP Promoted by the Formation of N2O Mittova, I. Ya.
2002
31 2 p. 79-83
article
21 Two-Dimensional Epitaxial Nucleation with Large Critical-Nucleus Size I. G. Neizvestny
2002
31 2 p. 70-78
9 p.
article
22 Two-Dimensional Epitaxial Nucleation with Large Critical-Nucleus Size Neizvestny, I. G.
2002
31 2 p. 70-78
article
23 Wet Etching of Ion-Implanted Silicon Dioxide Monitored by Atomic-Force Microscopy A. A. Bukharaev
2002
31 2 p. 103-109
7 p.
article
24 Wet Etching of Ion-Implanted Silicon Dioxide Monitored by Atomic-Force Microscopy Bukharaev, A. A.
2002
31 2 p. 103-109
article
                             24 results found
 
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