| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Characterization of poly-Si thin-film solar cell functions and parameters with IR optical interaction techniques
|
Boostandoost, M.
|
|
2011
|
22 |
10 |
p. 1553-1579
|
artikel
|
| 2 |
Conductive filament formation in printed circuit boards: effects of reflow conditions and flame retardants
|
Sood, Bhanu
|
|
2011
|
22 |
10 |
p. 1602-1615
|
artikel
|
| 3 |
Disassembly methodology for conducting failure analysis on lithium–ion batteries
|
Williard, Nick
|
|
2011
|
22 |
10 |
p. 1616-1630
|
artikel
|
| 4 |
Extending acoustic microscopy for comprehensive failure analysis applications
|
Brand, Sebastian
|
|
2011
|
22 |
10 |
p. 1580-1593
|
artikel
|
| 5 |
Failure localization with active and passive voltage contrast in FIB and SEM
|
Rosenkranz, Ruediger
|
|
2011
|
22 |
10 |
p. 1523-1535
|
artikel
|
| 6 |
Innovative methodologies of circuit edit by focused ion beam (FIB) on wafer-level chip-scale-package (WLCSP) devices
|
Liu, Tao-Chi
|
|
2011
|
22 |
10 |
p. 1536-1541
|
artikel
|
| 7 |
Introduction
|
Knauss, Lee
|
|
2011
|
22 |
10 |
p. 1509-1510
|
artikel
|
| 8 |
LA ICP-MS in microelectronics failure analysis
|
Pan, Zixiao
|
|
2011
|
22 |
10 |
p. 1594-1601
|
artikel
|
| 9 |
Screening for counterfeit electronic parts
|
Sood, Bhanu
|
|
2011
|
22 |
10 |
p. 1511-1522
|
artikel
|
| 10 |
Two-photon absorption laser assisted device alteration using continuous wave 1,340 nm laser
|
Niu, Baohua
|
|
2011
|
22 |
10 |
p. 1542-1552
|
artikel
|
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