| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
ADC Dynamic Parameter Testing Scheme Under Relaxed Conditions
|
Yuan, Jun
|
|
|
40 |
4 |
p. 457-468
|
article
|
| 2 |
A Defect Detection Method of Mixed Wafer Map Using Neighborhood Path Filtering Clustering Algorithm
|
Hou, Xingna
|
|
|
40 |
4 |
p. 419-433
|
article
|
| 3 |
An Automatic Software Testing Method to Discover Hard-to-Detect Faults Using Hybrid Olympiad Optimization Algorithm
|
Zheng, Leiqing
|
|
|
40 |
4 |
p. 539-556
|
article
|
| 4 |
Dynamic Smartcard Protection and SSELUR-GRU-Based Attack Stage Identification in Industrial IoT
|
Mouleeswaran, S. K.
|
|
|
40 |
4 |
p. 469-485
|
article
|
| 5 |
Editorial
|
Agrawal, Vishwani D.
|
|
|
40 |
4 |
p. 417-418
|
article
|
| 6 |
Formal Verification of a Dependable State Machine-Based Hardware Architecture for Safety-Critical Cyber-Physical Systems: Analysis, Design, and Implementation
|
Khairullah, Shawkat Sabah
|
|
|
40 |
4 |
p. 509-523
|
article
|
| 7 |
High-Dimensional Feature Fault Diagnosis Method Based on HEFS-LGBM
|
Li, Gen
|
|
|
40 |
4 |
p. 557-572
|
article
|
| 8 |
Interleaved Counter Matrix Code in SRAM Memories for Continuous Adjacent Multiple Bit Upset Correction
|
A, Ahilan
|
|
|
40 |
4 |
p. 525-537
|
article
|
| 9 |
Investigation of Silicon Aging Effects in Dopingless PUF for Reliable Security Solution
|
Panchore, Meena
|
|
|
40 |
4 |
p. 487-496
|
article
|
| 10 |
Pebble Traversal-Based Fault Detection and Advanced Reconfiguration Technique for Digital Microfluidic Biochips
|
Saha, Basudev
|
|
|
40 |
4 |
p. 573-587
|
article
|
| 11 |
Predicting Energy Dissipation in QCA-Based Layered-T Gates Under Cell Defects and Polarisation: A Study with Machine-Learning Models
|
Dhar, Manali
|
|
|
40 |
4 |
p. 435-455
|
article
|
| 12 |
Verification and Validation with Prototype Chip Implemented with Layout Level Scan C-Elements
|
Iwata, Hiroshi
|
|
|
40 |
4 |
p. 497-508
|
article
|
Journal description