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10 results found

no	title	author	magazine	year	volume	issue	page(s)	type
1	A Tunable Concurrent BIST Design Based on Reconfigurable LFSR	Menbari, Ahmad			39	2	p. 245-262	article
2	Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation	Song, Tai			39	2	p. 189-205	article
3	Design of INV/BUFF Logic Locking For Enhancing the Hardware Security	Naveenkumar, R.			39	2	p. 141-153	article
4	Editorial	Agrawal, Vishwani D.			39	2	p. 123	article
5	Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial Network	Tang, Wenjing			39	2	p. 129-140	article
6	Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift	Jiang, Hui			39	2	p. 227-243	article
7	Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications	Melis, Tommaso			39	2	p. 171-187	article
8	Multiple Retest Systems for Screening High-Quality Chips	Yeh, Chung-Huang			39	2	p. 207-225	article
9	On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits	El Badawi, H.			39	2	p. 155-170	article
10	Test Technology Newsletter				39	2	p. 125-127	article

10 results found

Koninklijke Bibliotheek - National Library of the Netherlands