| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Aging-Resilient SRAM-based True Random Number Generator for Lightweight Devices
|
Wang, Wendong
|
|
|
36 |
3 |
p. 301-311
|
artikel
|
| 2 |
An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic
|
Mitra, Sanjoy
|
|
|
36 |
3 |
p. 327-342
|
artikel
|
| 3 |
A probability density estimation algorithm on multiwavelet for the high-resolution ADC
|
Ma, Min
|
|
|
36 |
3 |
p. 375-383
|
artikel
|
| 4 |
Comprehensive Analysis and Optimization of Reliable Viterbi Decoder Circuits Implemented in Modular VLSI Design Logic Styles
|
Varada, Sushanth
|
|
|
36 |
3 |
p. 343-363
|
artikel
|
| 5 |
Editorial
|
Agrawal, Vishwani D.
|
|
|
36 |
3 |
p. 297-298
|
artikel
|
| 6 |
High Performance Approximate Memories for Image Processing Applications
|
Jothin, R.
|
|
|
36 |
3 |
p. 419-428
|
artikel
|
| 7 |
Impact of Worst-Case Excitation for DDR interface Signal and Power Integrity Co-Simulation
|
Yu, Dongzhe
|
|
|
36 |
3 |
p. 365-374
|
artikel
|
| 8 |
LoBA: A Leading One Bit Based Imprecise Multiplier for Efficient Image Processing
|
Garg, Bharat
|
|
|
36 |
3 |
p. 429-437
|
artikel
|
| 9 |
Maximal Connectivity Test with Channel-Open Faults in On-Chip Communication Networks
|
Bhowmik, Biswajit
|
|
|
36 |
3 |
p. 385-408
|
artikel
|
| 10 |
Stuck-At Fault Mitigation of Emerging Technologies Based Switching Lattices
|
Anghel, Lorena
|
|
|
36 |
3 |
p. 313-326
|
artikel
|
| 11 |
Test Technology Newsletter
|
|
|
|
36 |
3 |
p. 299-300
|
artikel
|
| 12 |
Time Complexity Comparison of Stopping at First Failure and Completely Running the Test
|
Yucesan, Ongun
|
|
|
36 |
3 |
p. 409-417
|
artikel
|
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