| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
An Efficient Algorithm for Optimizing the Test Path of Digital Microfluidic Biochips
|
Huang, Xijun
|
|
|
36 |
2 |
p. 205-218
|
artikel
|
| 2 |
A Novel Approach of Data Content Zeroization Under Memory Attacks
|
Srivastava, Ankush
|
|
|
36 |
2 |
p. 147-167
|
artikel
|
| 3 |
Automated Bug Resistant Test Intent with Register Header Database for Optimized Verification
|
Sharma, Gaurav
|
|
|
36 |
2 |
p. 219-237
|
artikel
|
| 4 |
Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects
|
Copetti, T.
|
|
|
36 |
2 |
p. 271-284
|
artikel
|
| 5 |
Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs
|
Kaibartta, Tanusree
|
|
|
36 |
2 |
p. 239-253
|
artikel
|
| 6 |
Design and Optimization Methodology of Coplanar Waveguide Test Structures for Dielectric Characterization of Thin Films
|
Ge, Jinqun
|
|
|
36 |
2 |
p. 183-188
|
artikel
|
| 7 |
Editorial
|
Agrawal, Vishwani D.
|
|
|
36 |
2 |
p. 143-144
|
artikel
|
| 8 |
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits
|
El Badawi, H.
|
|
|
36 |
2 |
p. 189-203
|
artikel
|
| 9 |
Remaining Useful Life Prediction of Analog Circuit Using Improved Unscented Particle Filter
|
Rathnapriya, S.
|
|
|
36 |
2 |
p. 169-181
|
artikel
|
| 10 |
Soft Error Hardened Asymmetric 10T SRAM Cell for Aerospace Applications
|
Shah, Ambika Prasad
|
|
|
36 |
2 |
p. 255-269
|
artikel
|
| 11 |
Speed-Up in Test Methods Using Probabilistic Merit Indicators
|
Fooladi, Mahtab
|
|
|
36 |
2 |
p. 285-296
|
artikel
|
| 12 |
Test Technology Newsletter
|
|
|
|
36 |
2 |
p. 145-146
|
artikel
|
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