| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Low-Cost Test Solution for Reliable Communication in Networks-on-Chip
|
Bhowmik, Biswajit
|
|
2019
|
35 |
2 |
p. 215-243
|
artikel
|
| 2 |
An Integrated on-Silicon Verification Method for FPGA Overlays
|
Kourfali, Alexandra
|
|
2019
|
35 |
2 |
p. 173-189
|
artikel
|
| 3 |
A Unified Approach to Detect and Distinguish Hardware Trojans and Faults in SRAM-based FPGAs
|
Ranjbar, Omid
|
|
2019
|
35 |
2 |
p. 201-214
|
artikel
|
| 4 |
Characterization Method for Integrated Magnetic Devices at Lower Frequencies (up to 110 MHz)
|
Oumar, D. A.
|
|
2019
|
35 |
2 |
p. 245-252
|
artikel
|
| 5 |
Editorial
|
Agrawal, Vishwani D.
|
|
2019
|
35 |
2 |
p. 127-128
|
artikel
|
| 6 |
Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects
|
Medeiros, G. Cardoso
|
|
2019
|
35 |
2 |
p. 191-200
|
artikel
|
| 7 |
Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers
|
Grossi, Marco
|
|
2019
|
35 |
2 |
p. 261-267
|
artikel
|
| 8 |
Low-Cost Strategy for Bus Propagation Delay Reduction
|
Omaña, M.
|
|
2019
|
35 |
2 |
p. 253-260
|
artikel
|
| 9 |
Memory-Aware Design Space Exploration for Reliability Evaluation in Computing Systems
|
Kooli, Maha
|
|
2019
|
35 |
2 |
p. 145-162
|
artikel
|
| 10 |
Single Event Transient Propagation Probabilities Analysis for Nanometer CMOS Circuits
|
Cai, Shuo
|
|
2019
|
35 |
2 |
p. 163-172
|
artikel
|
| 11 |
Testing of Current Carrying Capacity of Conducting Tracks in High Power Flexible Printed Circuit Boards
|
K R, Remesh Kumar
|
|
2019
|
35 |
2 |
p. 131-143
|
artikel
|
| 12 |
Test Technology Newsletter
|
|
|
2019
|
35 |
2 |
p. 129-130
|
artikel
|
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