| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Layout-Based Rad-Hard DICE Flip-Flop Design
|
Wang, Haibin
|
|
2019
|
35 |
1 |
p. 111-117
|
artikel
|
| 2 |
Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies
|
Karel, Amit
|
|
2019
|
35 |
1 |
p. 59-75
|
artikel
|
| 3 |
An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging Effects
|
Gomez, Andres
|
|
2019
|
35 |
1 |
p. 87-100
|
artikel
|
| 4 |
An Optimized NS2 Module for UHF Passive RFID Systems
|
Benfraj, Rahma
|
|
2018
|
35 |
1 |
p. 45-58
|
artikel
|
| 5 |
Design of Two-Tone RF Generator for On-Chip IP3/IP2 Test
|
Ahmad, Shakeel
|
|
2019
|
35 |
1 |
p. 77-85
|
artikel
|
| 6 |
Editorial
|
Agrawal, Vishwani D.
|
|
2019
|
35 |
1 |
p. 1-2
|
artikel
|
| 7 |
Fault Tolerant Soft-Core Processor Architecture Based on Temporal Redundancy
|
Villa, Paulo R. C.
|
|
2019
|
35 |
1 |
p. 9-27
|
artikel
|
| 8 |
Impact of Negative Bias Temperature Instability on Gate-All-Around Flip-Flops
|
Taghipour, Shiva
|
|
2019
|
35 |
1 |
p. 119-125
|
artikel
|
| 9 |
2018JETTAReviewers
|
|
|
2019
|
35 |
1 |
p. 5-6
|
artikel
|
| 10 |
Metric-Driven Verification Methodology with Regression Management
|
Cieplucha, Marek
|
|
2019
|
35 |
1 |
p. 101-110
|
artikel
|
| 11 |
New Editors – 2019
|
|
|
2019
|
35 |
1 |
p. 3-4
|
artikel
|
| 12 |
RTOS Solution for NoC-Based COTS MPSoC Usage in Mixed-Criticality Systems
|
Avramenko, Serhiy
|
|
2019
|
35 |
1 |
p. 29-44
|
artikel
|
| 13 |
Test Technology Newsletter
|
|
|
2019
|
35 |
1 |
p. 7-8
|
artikel
|
Tijdschrift beschrijving