| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Jitter Injection Signal Generation and Extraction System for Embedded Test of High-Speed Data I/O
|
Li, Yan
|
|
2016
|
32 |
4 |
p. 423-436
|
artikel
|
| 2 |
An Efficient Contact Screening Method and its Application to High-Reliability Non-Volatile Memories
|
Leisenberger, Friedrich Peter
|
|
2016
|
32 |
4 |
p. 447-458
|
artikel
|
| 3 |
A New Approach for Modeling Inconsistencies in Digital-Assisted Analog Design
|
Uygur, Gürkan
|
|
2016
|
32 |
4 |
p. 491-503
|
artikel
|
| 4 |
A 65nm CMOS Ramp Generator Design and its Application Towards a BIST Implementation of the Reduced-Code Static Linearity Test Technique for Pipeline ADCs
|
Renaud, Guillaume
|
|
2016
|
32 |
4 |
p. 407-421
|
artikel
|
| 5 |
A Wideband Digital-to-Frequency Converter with Built-In Mechanism for Self-Interference Mitigation
|
Bashir, Imran
|
|
2016
|
32 |
4 |
p. 437-445
|
artikel
|
| 6 |
Editorial
|
Agrawal, Vishwani D.
|
|
2016
|
32 |
4 |
p. 399
|
artikel
|
| 7 |
Fault Diagnosis in Highly Dependable Medical Wearable Systems
|
Oliveira, Cristina C.
|
|
2016
|
32 |
4 |
p. 467-479
|
artikel
|
| 8 |
Guest Editorial: Analog, Mixed-Signal and RF Testing
|
Léger, Gildas
|
|
2016
|
32 |
4 |
p. 405-406
|
artikel
|
| 9 |
Interconnect Reliability Analysis for Power Amplifier Based on Artificial Neural Networks
|
Lin, Qian
|
|
2016
|
32 |
4 |
p. 481-489
|
artikel
|
| 10 |
Test Technology Newsletter
|
|
|
2016
|
32 |
4 |
p. 401-403
|
artikel
|
| 11 |
The Faults Diagnostic Analysis for Analog Circuit Based on FA-TM-ELM
|
Yu, WenXin
|
|
2016
|
32 |
4 |
p. 459-465
|
artikel
|
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