| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Adaptive Bayesian Diagnosis of Intermittent Faults
|
Gómez, Laura Rodríguez
|
|
2014
|
30 |
5 |
p. 527-540
|
artikel
|
| 2 |
A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients
|
Pahlevanzadeh, Hoda
|
|
2014
|
30 |
5 |
p. 595-609
|
artikel
|
| 3 |
Dynamic Threshold Delay Characterization Model for Improved Static Timing Analysis
|
Bhatnagar, Pulkit
|
|
2014
|
30 |
5 |
p. 495-504
|
artikel
|
| 4 |
Dynamic X-filling for Peak Capture Power Reduction for Compact Test Sets
|
Eggersglüß, Stephan
|
|
2014
|
30 |
5 |
p. 557-567
|
artikel
|
| 5 |
Editorial
|
Agrawal, Vishwani D.
|
|
2014
|
30 |
5 |
p. 491-492
|
artikel
|
| 6 |
Estiamtion and Correction of Mismatch Errors in Time-Interleaved ADCs
|
Wang, Zhigang
|
|
2014
|
30 |
5 |
p. 629-635
|
artikel
|
| 7 |
Fault Diagnosis of Analog Circuit Based on High-Order Cumulants and Information Fusion
|
Xie, Tao
|
|
2014
|
30 |
5 |
p. 505-514
|
artikel
|
| 8 |
Intra-Cell Defects Diagnosis
|
Sun, Z.
|
|
2014
|
30 |
5 |
p. 541-555
|
artikel
|
| 9 |
Low Cost Built-in Sensor Testing of Phase-Locked Loop Dynamic Parameters
|
Hsiao, Sen-Wen
|
|
2014
|
30 |
5 |
p. 515-526
|
artikel
|
| 10 |
On the Test and Mitigation of Malfunctions in Low-Power SRAMs
|
Bonet Zordan, L. H.
|
|
2014
|
30 |
5 |
p. 611-627
|
artikel
|
| 11 |
Optimal Test Scheduling Formulation under Power Constraints with Dynamic Voltage and Frequency Scaling
|
Millican, Spencer K.
|
|
2014
|
30 |
5 |
p. 569-580
|
artikel
|
| 12 |
Testing Methods for PUF-Based Secure Key Storage Circuits
|
Cortez, Mafalda
|
|
2014
|
30 |
5 |
p. 581-594
|
artikel
|
| 13 |
Test Technology Newsletter
|
|
|
2014
|
30 |
5 |
p. 493-494
|
artikel
|
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