nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic
|
Possamai Bastos, Rodrigo |
|
2013 |
29 |
3 |
p. 331-340 |
artikel |
2 |
A Practical Approach to Single Event Transient Analysis for Highly Complex Design
|
Costenaro, Enrico |
|
2013 |
29 |
3 |
p. 301-315 |
artikel |
3 |
A Preliminary Study about SEU Effects on Programmable Interconnections of SRAM-based FPGAs
|
Alderighi, M. |
|
2013 |
29 |
3 |
p. 341-350 |
artikel |
4 |
A Probabilistic Approach to Diagnose SETs in Sequential Circuits
|
Gangadhar, Sreenivas |
|
2013 |
29 |
3 |
p. 317-330 |
artikel |
5 |
A Region-based Fault-Tolerant Routing Algorithmfor 2D Irregular Mesh Network-on-Chip
|
Fukushima, Yusuke |
|
2013 |
29 |
3 |
p. 415-429 |
artikel |
6 |
A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects
|
Shi, Yiwen |
|
2013 |
29 |
3 |
p. 275-288 |
artikel |
7 |
Editorial
|
Agrawal, Vishwani D. |
|
2013 |
29 |
3 |
p. 255 |
artikel |
8 |
Fault Analysis and Evaluation of a True Random Number Generator Embedded in a Processor
|
Soucarros, Mathilde |
|
2013 |
29 |
3 |
p. 367-381 |
artikel |
9 |
Guest Editorial
|
Joshi, Prashant D. |
|
2013 |
29 |
3 |
p. 259-260 |
artikel |
10 |
Low Cost Concurrent Error Detection Strategy for the Control Logic of High Performance Microprocessors and Its Application to the Instruction Decoder
|
Rossi, D. |
|
2013 |
29 |
3 |
p. 401-413 |
artikel |
11 |
On the Delay of a CNTFET with Undeposited CNTs by Gate Width Adjustment
|
Cho, Geunho |
|
2013 |
29 |
3 |
p. 261-273 |
artikel |
12 |
On the Impact of Performance Faults in Modern Microprocessors
|
Karimi, Naghmeh |
|
2013 |
29 |
3 |
p. 351-366 |
artikel |
13 |
Partial Virtual Channel Sharing: A Generic Methodology to Enhance Resource Management and Fault Tolerance in Networks-on-Chip
|
Latif, Khalid |
|
2013 |
29 |
3 |
p. 431-452 |
artikel |
14 |
Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion
|
Vazquez, J. C. |
|
2013 |
29 |
3 |
p. 289-299 |
artikel |
15 |
Test Technology Newsletter
|
|
|
2013 |
29 |
3 |
p. 257 |
artikel |
16 |
Using Error Correcting Codes Without Speed Penalty in Embedded Memories: Algorithm, Implementation and Case Study
|
Bonnoit, Thierry |
|
2013 |
29 |
3 |
p. 383-400 |
artikel |