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                             9 results found
no title author magazine year volume issue page(s) type
1 A Framework for Automated Detection of Power-related Software Errors in Industrial Verification Processes Gandini, Stefano
 2010
 26 6 p. 689-697
 article
2 An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis Ladhar, Aymen
 2010
 26 6 p. 621-639
 article
3 Chiba Scan Delay Fault Testing with Short Test Application Time Namba, Kazuteru
 2010
 26 6 p. 667-677
 article
4 Editorial Agrawal, Vishwani D.
 2010
 26 6 p. 595-596
 article
5 Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture Hannu, Jari
 2010
 26 6 p. 641-658
 article
6 Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead Mehta, Usha Sandeep
 2010
 26 6 p. 679-688
 article
7 On-Chip Delay Measurement Based Response Analysis for Timing Characterization Datta, Ramyanshu
 2010
 26 6 p. 599-619
 article
8 Study of Read Recovery Dynamic Faults in 6T SRAMS and Method to Improve Test Time Dubey, Prashant
 2010
 26 6 p. 659-666
 article
9 Test Technology Newsletter 2010
 26 6 p. 597-598
 article
                             9 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands