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                             9 results found
no title author magazine year volume issue page(s) type
1 A BIST Solution for Frequency Domain Characterization of Analog Circuits Barragán, Manuel J.
 2010
 26 4 p. 429-441
 article
2 A New Built-in TPG Based on Berlekamp–Massey Algorithm Souza, Cleonilson Protásio de
 2010
 26 4 p. 443-451
 article
3 Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism Berg, Ardy van den
 2010
 26 4 p. 453-464
 article
4 Editorial Agrawal, Vishwani D.
 2010
 26 4 p. 401
 article
5 On the Application of Dynamic Scan Chain Partitioning for Reducing Peak Shift Power Almukhaizim, Sobeeh
 2010
 26 4 p. 465-481
 article
6 On the Duality of Probing and Fault Attacks Gammel, Berndt M.
 2010
 26 4 p. 483-493
 article
7 Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices Srinivasan, Ganesh
 2010
 26 4 p. 405-417
 article
8 Test Generation Algorithm for Linear Systems Based on Genetic Algorithm Long, Ting
 2010
 26 4 p. 419-428
 article
9 Test Technology Newsletter 2010
 26 4 p. 403-404
 article
                             9 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands