| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method
|
Jalón, M. A.
|
|
2010
|
26 |
1 |
p. 47-58
|
artikel
|
| 2 |
Applications for Low Frequency Impedance Analysis Systems
|
Giassa, Matthew
|
|
2009
|
26 |
1 |
p. 139-144
|
artikel
|
| 3 |
Calibration and Test Time Reduction Techniques for Digitally-Calibrated Designs: an ADC Case Study
|
Chang, Hsiu-Ming Sherman
|
|
2009
|
26 |
1 |
p. 59-71
|
artikel
|
| 4 |
Editorial
|
Agrawal, Vishwani D.
|
|
2009
|
26 |
1 |
p. 1-2
|
artikel
|
| 5 |
Estimation of RF PA Nonlinearities after Cross-correlating Current and Output Voltage
|
Mota, Pedro Fonseca
|
|
2010
|
26 |
1 |
p. 25-35
|
artikel
|
| 6 |
Fault Coverage Analysis of Peak-Detector Based BIST for RF LNAs
|
Ayadi, R. M.
|
|
2010
|
26 |
1 |
p. 37-45
|
artikel
|
| 7 |
General Design for Test Guidelines for RF IC
|
Fan, Qi
|
|
2009
|
26 |
1 |
p. 7-12
|
artikel
|
| 8 |
Guest Editorial
|
Arabi, Karim
|
|
2009
|
26 |
1 |
p. 5
|
artikel
|
| 9 |
Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic
|
Keezer, David
|
|
2009
|
26 |
1 |
p. 87-96
|
artikel
|
| 10 |
Low-Cost Specification Based Testing of RF Amplifier Circuits using Oscillation Principles
|
Goyal, Abhilash
|
|
2010
|
26 |
1 |
p. 13-24
|
artikel
|
| 11 |
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits
|
Shin, Hongjoong
|
|
2009
|
26 |
1 |
p. 73-86
|
artikel
|
| 12 |
Study of an Electrical Setup for Capacitive MEMS Accelerometers Test and Calibration
|
Dumas, Norbert
|
|
2009
|
26 |
1 |
p. 111-125
|
artikel
|
| 13 |
Testing Multilayer Flexible Wireless Multisensor Platforms
|
Chuo, Yindar
|
|
2009
|
26 |
1 |
p. 127-138
|
artikel
|
| 14 |
Test Technology Newsletter
|
|
|
2010
|
26 |
1 |
p. 3-4
|
artikel
|
| 15 |
Using Stochastic Differential Equation for Verification of Noise in Analog/RF Circuits
|
Narayanan, Rajeev
|
|
2009
|
26 |
1 |
p. 97-109
|
artikel
|
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