| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Case Study on Phase-Locked Loop Automatic Layout Generation and Transient Fault Injection Analysis
|
Lazzari, Cristiano
|
|
2007
|
23 |
6 |
p. 625-633
|
artikel
|
| 2 |
A Design-Based Structural Test Method for a Switched-Resistor DAC
|
Ma, Lei
|
|
2007
|
23 |
6 |
p. 559-567
|
artikel
|
| 3 |
A Fully-Settled Linear Behavior Plus Noise Model for Evaluating the Digital Stimuli of the Design-for-Digital-Testability Σ-Δ Modulators
|
Hong, Hao-Chiao
|
|
2007
|
23 |
6 |
p. 527-538
|
artikel
|
| 4 |
A Module for BiST of CMOS RF Receivers
|
Suenaga, Kay
|
|
2007
|
23 |
6 |
p. 605-612
|
artikel
|
| 5 |
A Robust 130 nm-CMOS Built-In Current Sensor Dedicated to RF Applications
|
Cimino, M.
|
|
2007
|
23 |
6 |
p. 593-603
|
artikel
|
| 6 |
Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis
|
Balen, T. R.
|
|
2007
|
23 |
6 |
p. 497-512
|
artikel
|
| 7 |
Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment
|
Saikkonen, Teuvo
|
|
2007
|
23 |
6 |
p. 569-579
|
artikel
|
| 8 |
Editorial
|
Agrawal, Vishwani D.
|
|
2007
|
23 |
6 |
p. 465
|
artikel
|
| 9 |
Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing
|
Bounceur, Ahcène
|
|
2007
|
23 |
6 |
p. 471-484
|
artikel
|
| 10 |
Fast PWM-Based Test for High Resolution ΣΔ ADCs
|
De Venuto, Daniela
|
|
2007
|
23 |
6 |
p. 539-548
|
artikel
|
| 11 |
Guest Editorial
|
Lubaszewski, Marcelo
|
|
2007
|
23 |
6 |
p. 469
|
artikel
|
| 12 |
Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing
|
Wegener, Carsten
|
|
2007
|
23 |
6 |
p. 513-525
|
artikel
|
| 13 |
Methods of Testing Discrete Semiconductors in the 1149.4 Environment
|
Hannu, Jari
|
|
2007
|
23 |
6 |
p. 581-592
|
artikel
|
| 14 |
Oscillation Test Scheme of SC Biquad Filters Based on Internal Reconfiguration
|
Kač, Uroš
|
|
2007
|
23 |
6 |
p. 485-495
|
artikel
|
| 15 |
Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST
|
Ting, Hsin-Wen
|
|
2007
|
23 |
6 |
p. 549-558
|
artikel
|
| 16 |
Reducing Test Time Using an Enhanced RF Loopback
|
Negreiros, Marcelo
|
|
2007
|
23 |
6 |
p. 613-623
|
artikel
|
| 17 |
Test Technology Newsletter - December 2007
|
Kim, Bruce
|
|
2007
|
23 |
6 |
p. 467-468
|
artikel
|
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