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                             9 results found
no title author magazine year volume issue page(s) type
1 A Formal Analysis of Fault Diagnosis with D-matrices Sheppard, J. W.
 2007
 23 4 p. 309-322
 article
2 Editorial 2007
 23 4 p. 271
 article
3 Ensembles of Neural Networks for Fault Diagnosis in Analog Circuits El-Gamal, M. A.
 2007
 23 4 p. 323-339
 article
4 Functionally Fault-tolerant DSP Microprocessor using Sigma–delta Modulated Signals Schüler, Erik
 2007
 23 4 p. 275-292
 article
5 IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection Li, Katherine Shu-Min
 2007
 23 4 p. 341-355
 article
6 MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs Chun, Sunghoon
 2007
 23 4 p. 357-362
 article
7 Techniques for Disturb Fault Collapsing Mohammad, Mohammad Gh.
 2007
 23 4 p. 363-368
 article
8 Test Technology Newsletter 2007
 23 4 p. 273-274
 article
9 The Effectiveness of Test in Controlling Quality Costs: A Conformability Analysis Based Approach Gilbert, J. M.
 2007
 23 4 p. 293-307
 article
                             9 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands