| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A BIST Scheme for SNDR Testing of ΣΔ ADCs Using Sine-Wave Fitting
|
Rolíndez, Luis
|
|
2006
|
22 |
4-6 |
p. 325-335
|
artikel
|
| 2 |
A First Step for an INL Spectral-Based BIST: The Memory Optimization
|
Kerzérho, V.
|
|
2006
|
22 |
4-6 |
p. 351-357
|
artikel
|
| 3 |
A 1-MHz Area-Efficient On-Chip Spectrum Analyzer for Analog Testing
|
Domínguez, M. A.
|
|
2006
|
22 |
4-6 |
p. 437-448
|
artikel
|
| 4 |
Built-In-Self-Testing Techniques for Programmable Capacitor Arrays
|
Laknaur, Amit
|
|
2006
|
22 |
4-6 |
p. 449-462
|
artikel
|
| 5 |
Editorial
|
Agrawal, Vishwani D.
|
|
2006
|
22 |
4-6 |
p. 307
|
artikel
|
| 6 |
Embedded System Level Self-Test for Mixed-Signal IO Verification
|
Loukusa, V.
|
|
2006
|
22 |
4-6 |
p. 463-470
|
artikel
|
| 7 |
Guest Editorial
|
Mir, Salvador
|
|
2006
|
22 |
4-6 |
p. 311
|
artikel
|
| 8 |
Investigation into the Use of Hybrid Solutions for ΣΔ A/D Converter Testing
|
Georgopoulos, K.
|
|
2006
|
22 |
4-6 |
p. 359-370
|
artikel
|
| 9 |
Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects
|
Xuan, Xiangdong
|
|
2006
|
22 |
4-6 |
p. 471-482
|
artikel
|
| 10 |
Next Generation ADC Massive Parallel Testing with Real Time Parameter Evaluation
|
Mattes, Heinz
|
|
2006
|
22 |
4-6 |
p. 337-350
|
artikel
|
| 11 |
On-Chip Random Jitter Testing Using Low Tap-Count Coarse Delay Lines
|
Huang, Jiun-Lang
|
|
2006
|
22 |
4-6 |
p. 387-398
|
artikel
|
| 12 |
Proposal of Fault Diagnosis of Analog Circuits by Combining Operation-Region Model and X–Y Zoning Method: Case Study
|
Miura, Yukiya
|
|
2006
|
22 |
4-6 |
p. 411-423
|
artikel
|
| 13 |
Structural Fault Modeling and Fault Detection Through Neyman–Pearson Decision Criteria for Analog Integrated Circuits
|
Zjajo, Amir
|
|
2006
|
22 |
4-6 |
p. 399-409
|
artikel
|
| 14 |
TBSA: Threshold-Based Simulation Accuracy Method for Fast Analog DC Fault Simulation
|
Morneau, Michel
|
|
2006
|
22 |
4-6 |
p. 425-436
|
artikel
|
| 15 |
Test Development Through Defect and Test Escape Level Estimation for Data Converters
|
Wegener, Carsten
|
|
2006
|
22 |
4-6 |
p. 313-324
|
artikel
|
| 16 |
Test Technology Newsletter
|
|
|
2006
|
22 |
4-6 |
p. 309-310
|
artikel
|
| 17 |
Towards Fault-Tolerant RF Front Ends
|
Das, Tejasvi
|
|
2006
|
22 |
4-6 |
p. 371-386
|
artikel
|
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