| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Flexible Approach for Defining Distributed Dependable Tests in SNMP-Based Network Management Systems
|
Luis Carlos Erpen De Bona
|
|
2004
|
20 |
4 |
p. 447-454
8 p.
|
artikel
|
| 2 |
A Flexible Approach for Defining Distributed Dependable Tests in SNMP-Based Network Management Systems
|
De Bona, Luis Carlos Erpen
|
|
2004
|
20 |
4 |
p. 447-454
|
artikel
|
| 3 |
A New Approach to Software-Implemented Fault Tolerance
|
M. Rebaudengo
|
|
2004
|
20 |
4 |
p. 433-437
5 p.
|
artikel
|
| 4 |
A New Approach to Software-Implemented Fault Tolerance
|
Rebaudengo, M.
|
|
2004
|
20 |
4 |
p. 433-437
|
artikel
|
| 5 |
A New FPGA for DSP Applications Integrating BIST Capabilities
|
Alex Gonsales
|
|
2004
|
20 |
4 |
p. 423-431
9 p.
|
artikel
|
| 6 |
A New FPGA for DSP Applications Integrating BIST Capabilities
|
Gonsales, Alex
|
|
2004
|
20 |
4 |
p. 423-431
|
artikel
|
| 7 |
Correlation Between Static and Dynamic Parameters of A-to-D Converters In the View of a Unique Test Procedure
|
F. Azaïs
|
|
2004
|
20 |
4 |
p. 375-387
13 p.
|
artikel
|
| 8 |
Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure
|
Azaïs, F.
|
|
2004
|
20 |
4 |
p. 375-387
|
artikel
|
| 9 |
Datapath BIST Insertion Using Pre-Characterized Area and Testability Data
|
J.C. Wang
|
|
2004
|
20 |
4 |
p. 333-344
12 p.
|
artikel
|
| 10 |
Datapath BIST Insertion Using Pre-Characterized Area and Testability Data
|
Wang, J.C.
|
|
2004
|
20 |
4 |
p. 333-344
|
artikel
|
| 11 |
Editorial
|
Vishwani D. Agrawal
|
|
2004
|
20 |
4 |
p. 327-327
1 p.
|
artikel
|
| 12 |
Editorial
|
Agrawal, Vishwani D.
|
|
2004
|
20 |
4 |
p. 327
|
artikel
|
| 13 |
Guest Editorial
|
Fabian Vargas
|
|
2004
|
20 |
4 |
p. 331-332
2 p.
|
artikel
|
| 14 |
Guest Editorial
|
Vargas, Fabian
|
|
2004
|
20 |
4 |
p. 331-332
|
artikel
|
| 15 |
Merging a DSP-Oriented Signal Integrity Technique and SW-Based Fault Handling Mechanisms to Ensure Reliable DSP Systems
|
Fabian Vargas
|
|
2004
|
20 |
4 |
p. 397-411
15 p.
|
artikel
|
| 16 |
Merging a DSP-Oriented Signal Integrity Technique and SW-Based Fault Handling Mechanisms to Ensure Reliable DSP Systems
|
Vargas, Fabian
|
|
2004
|
20 |
4 |
p. 397-411
|
artikel
|
| 17 |
Mutation Analysis and Constraint-Based Criteria Results from an Empirical Evaluation in the Context of Software Testing
|
Inali Wisniewski Soares
|
|
2004
|
20 |
4 |
p. 439-445
7 p.
|
artikel
|
| 18 |
Mutation Analysis and Constraint-Based Criteria: Results from an Empirical Evaluation in the Context of Software Testing
|
Soares, Inali Wisniewski
|
|
2004
|
20 |
4 |
p. 439-445
|
artikel
|
| 19 |
On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level
|
M.B. Santos
|
|
2004
|
20 |
4 |
p. 345-355
11 p.
|
artikel
|
| 20 |
On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level
|
Santos, M.B.
|
|
2004
|
20 |
4 |
p. 345-355
|
artikel
|
| 21 |
Oscillation Test Strategy A Case Study
|
Eduardo Romero
|
|
2004
|
20 |
4 |
p. 389-396
8 p.
|
artikel
|
| 22 |
Oscillation Test Strategy: A Case Study
|
Romero, Eduardo
|
|
2004
|
20 |
4 |
p. 389-396
|
artikel
|
| 23 |
Searching for Global Test Costs Optimization in Core-Based Systems
|
Érika Cota
|
|
2004
|
20 |
4 |
p. 357-373
17 p.
|
artikel
|
| 24 |
Searching for Global Test Costs Optimization in Core-Based Systems
|
Cota, Érika
|
|
2004
|
20 |
4 |
p. 357-373
|
artikel
|
| 25 |
Simulating Single Event Transients in VDSM ICs for Ground Level Radiation
|
Dan Alexandrescu
|
|
2004
|
20 |
4 |
p. 413-421
9 p.
|
artikel
|
| 26 |
Simulating Single Event Transients in VDSM ICs for Ground Level Radiation
|
Alexandrescu, Dan
|
|
2004
|
20 |
4 |
p. 413-421
|
artikel
|
| 27 |
Test Technology Technical Council Newsletter
|
P. Prinetto
|
|
2004
|
20 |
4 |
p. 329-329
1 p.
|
artikel
|
| 28 |
Test Technology Technical Council Newsletter
|
Prinetto, P.
|
|
2004
|
20 |
4 |
p. 329
|
artikel
|
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