| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Note on System-on-Chip Test Scheduling Formulation
|
Sandeep Koranne
|
|
2004
|
20 |
3 |
p. 309-313
5 p.
|
artikel
|
| 2 |
A Note on System-on-Chip Test Scheduling Formulation
|
Koranne, Sandeep
|
|
2004
|
20 |
3 |
p. 309-313
|
artikel
|
| 3 |
Application-Specific Bridging Fault Testing of FPGAs
|
Mehdi Baradaran Tahoori
|
|
2004
|
20 |
3 |
p. 279-289
11 p.
|
artikel
|
| 4 |
Application-Specific Bridging Fault Testing of FPGAs
|
Tahoori, Mehdi Baradaran
|
|
2004
|
20 |
3 |
p. 279-289
|
artikel
|
| 5 |
Code Generation for Functional Validation of Pipelined Microprocessors
|
F. Corno
|
|
2004
|
20 |
3 |
p. 269-278
10 p.
|
artikel
|
| 6 |
Code Generation for Functional Validation of Pipelined Microprocessors
|
Corno, F.
|
|
2004
|
20 |
3 |
p. 269-278
|
artikel
|
| 7 |
Distributed Diagnosis of Interconnections in SoC and MCM Designs
|
Rajesh Pendurkar
|
|
2004
|
20 |
3 |
p. 291-307
17 p.
|
artikel
|
| 8 |
Distributed Diagnosis of Interconnections in SoC and MCM Designs
|
Pendurkar, Rajesh
|
|
2004
|
20 |
3 |
p. 291-307
|
artikel
|
| 9 |
Editorial
|
Vishwani D. Agrawal
|
|
2004
|
20 |
3 |
p. 219-219
1 p.
|
artikel
|
| 10 |
Editorial
|
Agrawal, Vishwani D.
|
|
2004
|
20 |
3 |
p. 219
|
artikel
|
| 11 |
Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors
|
S. Bernard
|
|
2004
|
20 |
3 |
p. 257-267
11 p.
|
artikel
|
| 12 |
Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors
|
Bernard, S.
|
|
2004
|
20 |
3 |
p. 257-267
|
artikel
|
| 13 |
Efficient March Tests for a Reduced 3-Coupling and 4-Coupling Faults in Random-Access Memories
|
Petru Cacaval
|
|
2004
|
20 |
3 |
p. 227-243
17 p.
|
artikel
|
| 14 |
Efficient March Tests for a Reduced 3-Coupling and 4-Coupling Faults in Random-Access Memories
|
Caşcaval, Petru
|
|
2004
|
20 |
3 |
p. 227-243
|
artikel
|
| 15 |
Memory Fault Modeling Trends A Case Study
|
Said Hamdioui
|
|
2004
|
20 |
3 |
p. 245-255
11 p.
|
artikel
|
| 16 |
Memory Fault Modeling Trends: A Case Study
|
Hamdioui, Said
|
|
2004
|
20 |
3 |
p. 245-255
|
artikel
|
| 17 |
New Non-Scan DFT Techniques to Achieve 100 Fault Efficiency
|
Debesh Kumar Das
|
|
2004
|
20 |
3 |
p. 315-323
9 p.
|
artikel
|
| 18 |
New Non-Scan DFT Techniques to Achieve 100% Fault Efficiency
|
Das, Debesh Kumar
|
|
2004
|
20 |
3 |
p. 315-323
|
artikel
|
| 19 |
Test Technology Technical Council Newsletter
|
Paolo Prinetto
|
|
2004
|
20 |
3 |
p. 221-225
5 p.
|
artikel
|
| 20 |
Test Technology Technical Council Newsletter
|
Prinetto, Paolo
|
|
2004
|
20 |
3 |
p. 221-225
|
artikel
|
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