nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A Low Power Pseudo-Random BIST Technique
|
Nadir Z. Basturkmen |
|
2003 |
19 |
6 |
p. 637-644 8 p. |
artikel |
2 |
A Low Power Pseudo-Random BIST Technique
|
Basturkmen, Nadir Z. |
|
2003 |
19 |
6 |
p. 637-644 |
artikel |
3 |
2003 Annual Index
|
|
|
2003 |
19 |
6 |
p. 659-670 12 p. |
artikel |
4 |
2003 Annual Index
|
|
|
2003 |
19 |
6 |
p. 659-670 |
artikel |
5 |
Defect Diagnosis Using a Current Ratio Based Quiescent Signal Analysis Model for Commercial Power Grids
|
Chintan Patel |
|
2003 |
19 |
6 |
p. 611-623 13 p. |
artikel |
6 |
Defect Diagnosis Using a Current Ratio Based Quiescent Signal Analysis Model for Commercial Power Grids
|
Patel, Chintan |
|
2003 |
19 |
6 |
p. 611-623 |
artikel |
7 |
Editorial
|
Vishwani D. Agrawal |
|
2003 |
19 |
6 |
p. 607-607 1 p. |
artikel |
8 |
Editorial
|
Agrawal, Vishwani D. |
|
2003 |
19 |
6 |
p. 607 |
artikel |
9 |
On Faster IDDQ Measurements
|
C. Thibeault |
|
2003 |
19 |
6 |
p. 625-635 11 p. |
artikel |
10 |
On Faster IDDQ Measurements
|
Thibeault, C. |
|
2003 |
19 |
6 |
p. 625-635 |
artikel |
11 |
Primitive Polynomials Over GF(2) of Degree up to 660 with Uniformly Distributed Coefficients
|
Janusz Rajski |
|
2003 |
19 |
6 |
p. 645-657 13 p. |
artikel |
12 |
Primitive Polynomials Over GF(2) of Degree up to 660 with Uniformly Distributed Coefficients
|
Rajski, Janusz |
|
2003 |
19 |
6 |
p. 645-657 |
artikel |
13 |
Test Technology Technical Council Newsletter
|
A. Ivanov |
|
2003 |
19 |
6 |
p. 609-610 2 p. |
artikel |
14 |
Test Technology Technical Council Newsletter
|
Ivanov, A. |
|
2003 |
19 |
6 |
p. 609-610 |
artikel |