| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A DFT Technique for Testing High-Speed Circuits with Arbitrarily Slow Testers
|
Muhammad Nummer
|
|
2003
|
19 |
3 |
p. 299-314
16 p.
|
artikel
|
| 2 |
A DFT Technique for Testing High-Speed Circuits with Arbitrarily Slow Testers
|
Nummer, Muhammad
|
|
2003
|
19 |
3 |
p. 299-314
|
artikel
|
| 3 |
A Novel Built-In Self-Repair Approach for Embedded RAMs
|
Shyue-Kung Lu
|
|
2003
|
19 |
3 |
p. 315-324
10 p.
|
artikel
|
| 4 |
A Novel Built-In Self-Repair Approach for Embedded RAMs
|
Lu, Shyue-Kung
|
|
2003
|
19 |
3 |
p. 315-324
|
artikel
|
| 5 |
A Ring Architecture Strategy for BIST Test Pattern Generation
|
C. Fagot
|
|
2003
|
19 |
3 |
p. 223-231
9 p.
|
artikel
|
| 6 |
A Ring Architecture Strategy for BIST Test Pattern Generation
|
Fagot, C.
|
|
2003
|
19 |
3 |
p. 223-231
|
artikel
|
| 7 |
Built-in Test with Modified-Booth High-Speed Pipelined Multipliers and Dividers
|
Hao-Yung Lo
|
|
2003
|
19 |
3 |
p. 245-269
25 p.
|
artikel
|
| 8 |
Built-in Test with Modified-Booth High-Speed Pipelined Multipliers and Dividers
|
Lo, Hao-Yung
|
|
2003
|
19 |
3 |
p. 245-269
|
artikel
|
| 9 |
Easily Testable Cellular Carry Lookahead Adders
|
Dimitris Gizopoulos
|
|
2003
|
19 |
3 |
p. 285-298
14 p.
|
artikel
|
| 10 |
Easily Testable Cellular Carry Lookahead Adders
|
Gizopoulos, Dimitris
|
|
2003
|
19 |
3 |
p. 285-298
|
artikel
|
| 11 |
Editorial
|
Vishwani D. Agrawal
|
|
2003
|
19 |
3 |
p. 219-219
1 p.
|
artikel
|
| 12 |
Editorial
|
Agrawal, Vishwani D.
|
|
2003
|
19 |
3 |
p. 219
|
artikel
|
| 13 |
Leakage Current in Sub-Quarter Micron MOSFET A Perspective on Stressed Delta IDDQ Testing
|
Oleg Semenov
|
|
2003
|
19 |
3 |
p. 341-352
12 p.
|
artikel
|
| 14 |
Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta IDDQ Testing
|
Semenov, Oleg
|
|
2003
|
19 |
3 |
p. 341-352
|
artikel
|
| 15 |
LFSR Characteristic Polynomials for Pseudo-Exhaustive TPG with Low Number of Seeds
|
Dimitri Kagaris
|
|
2003
|
19 |
3 |
p. 233-244
12 p.
|
artikel
|
| 16 |
LFSR Characteristic Polynomials for Pseudo-Exhaustive TPG with Low Number of Seeds
|
Kagaris, Dimitri
|
|
2003
|
19 |
3 |
p. 233-244
|
artikel
|
| 17 |
Modeling Fault Coverage of Random Test Patterns
|
Hailong Cui
|
|
2003
|
19 |
3 |
p. 271-284
14 p.
|
artikel
|
| 18 |
Modeling Fault Coverage of Random Test Patterns
|
Cui, Hailong
|
|
2003
|
19 |
3 |
p. 271-284
|
artikel
|
| 19 |
Replacing IDDQ Testing With Variance Reduction
|
C. Thibeault
|
|
2003
|
19 |
3 |
p. 325-340
16 p.
|
artikel
|
| 20 |
Replacing IDDQ Testing: With Variance Reduction
|
Thibeault, C.
|
|
2003
|
19 |
3 |
p. 325-340
|
artikel
|
| 21 |
Test Technology Technical Council Newsletter
|
A. Ivanov
|
|
2003
|
19 |
3 |
p. 221-222
2 p.
|
artikel
|
| 22 |
Test Technology Technical Council Newsletter
|
Ivanov, A.
|
|
2003
|
19 |
3 |
p. 221-222
|
artikel
|
| 23 |
Thermal Testing of Analogue Integrated Circuits A Case Study
|
J. Altet
|
|
2003
|
19 |
3 |
p. 353-357
5 p.
|
artikel
|
| 24 |
Thermal Testing of Analogue Integrated Circuits: A Case Study
|
Altet, J.
|
|
2003
|
19 |
3 |
p. 353-357
|
artikel
|
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