| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs
|
F. Azaïs
|
|
2001
|
17 |
2 |
p. 139-147
9 p.
|
artikel
|
| 2 |
A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs
|
Azaïs, F.
|
|
2001
|
17 |
2 |
p. 139-147
|
artikel
|
| 3 |
An Effective Deterministic BIST Scheme for Shifter/Accumulator Pairs in Datapaths
|
Nektarios Kranitis
|
|
2001
|
17 |
2 |
p. 97-107
11 p.
|
artikel
|
| 4 |
An Effective Deterministic BIST Scheme for Shifter/Accumulator Pairs in Datapaths
|
Kranitis, Nektarios
|
|
2001
|
17 |
2 |
p. 97-107
|
artikel
|
| 5 |
An Isochronous Testing Strategy for Hierarchical Adaptive Distributed System-Level Diagnosis
|
Alessandro Brawerman
|
|
2001
|
17 |
2 |
p. 185-195
11 p.
|
artikel
|
| 6 |
An Isochronous Testing Strategy for Hierarchical Adaptive Distributed System-Level Diagnosis
|
Brawerman, Alessandro
|
|
2001
|
17 |
2 |
p. 185-195
|
artikel
|
| 7 |
Call for Papers
|
|
|
2001
|
17 |
2 |
p. 197-197
1 p.
|
artikel
|
| 8 |
Call for Papers
|
|
|
2001
|
17 |
2 |
p. 197
|
artikel
|
| 9 |
Constraint Based Criteria An Approach for Test Case Selection in the Structural Testing
|
Silvia Regina Vergilio
|
|
2001
|
17 |
2 |
p. 175-183
9 p.
|
artikel
|
| 10 |
Constraint Based Criteria: An Approach for Test Case Selection in the Structural Testing
|
Vergilio, Silvia Regina
|
|
2001
|
17 |
2 |
p. 175-183
|
artikel
|
| 11 |
Cost/Quality Trade-off in Synthesis for BIST
|
P. Bukovjan
|
|
2001
|
17 |
2 |
p. 109-119
11 p.
|
artikel
|
| 12 |
Cost/Quality Trade-off in Synthesis for BIST
|
Bukovjan, P.
|
|
2001
|
17 |
2 |
p. 109-119
|
artikel
|
| 13 |
Detectability Conditions of Full Opens in the Interconnections
|
Antonio Zenteno
|
|
2001
|
17 |
2 |
p. 85-95
11 p.
|
artikel
|
| 14 |
Detectability Conditions of Full Opens in the Interconnections
|
Zenteno, Antonio
|
|
2001
|
17 |
2 |
p. 85-95
|
artikel
|
| 15 |
Editorial
|
Vishwani D. Agrawal
|
|
2001
|
17 |
2 |
p. 79-79
1 p.
|
artikel
|
| 16 |
Editorial
|
Agrawal, Vishwani D.
|
|
2001
|
17 |
2 |
p. 79
|
artikel
|
| 17 |
Fault Models and Test Generation for OpAmp CircuitsThe FFM
|
José Vicente Calvano
|
|
2001
|
17 |
2 |
p. 121-138
18 p.
|
artikel
|
| 18 |
Fault Models and Test Generation for OpAmp Circuits—The FFM
|
Calvano, José Vicente
|
|
2001
|
17 |
2 |
p. 121-138
|
artikel
|
| 19 |
Guest Editorial
|
Marcelo Lubaszewski
|
|
2001
|
17 |
2 |
p. 83-84
2 p.
|
artikel
|
| 20 |
Guest Editorial
|
Lubaszewski, Marcelo
|
|
2001
|
17 |
2 |
p. 83-84
|
artikel
|
| 21 |
Improving Reconfigurable Systems Reliability by Combining Periodical Test and Redundancy Techniques A Case Study
|
Eduardo Augusto Bezerra
|
|
2001
|
17 |
2 |
p. 163-174
12 p.
|
artikel
|
| 22 |
Improving Reconfigurable Systems Reliability by Combining Periodical Test and Redundancy Techniques: A Case Study
|
Bezerra, Eduardo Augusto
|
|
2001
|
17 |
2 |
p. 163-174
|
artikel
|
| 23 |
Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults
|
Érika Cota
|
|
2001
|
17 |
2 |
p. 149-161
13 p.
|
artikel
|
| 24 |
Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults
|
Cota, Érika
|
|
2001
|
17 |
2 |
p. 149-161
|
artikel
|
| 25 |
Test Technology TC Newsletter
|
|
|
2001
|
17 |
2 |
p. 1-2
2 p.
|
artikel
|
| 26 |
Test Technology TC Newsletter
|
|
|
2001
|
17 |
2 |
p. 1-2
|
artikel
|
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