| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A High-Level EDA Environment for the Automatic Insertion of HD-BIST Structures
|
Benso, Alfredo
|
|
2000
|
16 |
3 |
p. 179-184
|
artikel
|
| 2 |
An Approach to Minimize the Test Configuration for the Logic Cells of the Xilinx XC4000 FPGAs Family
|
Renovell, M.
|
|
2000
|
16 |
3 |
p. 289-299
|
artikel
|
| 3 |
Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test Methodology
|
Manhaeve, H.
|
|
2000
|
16 |
3 |
p. 227-234
|
artikel
|
| 4 |
Combining Functional and Structural Approaches for Switched-Current Circuit Testing
|
Renovell, M.
|
|
2000
|
16 |
3 |
p. 259-267
|
artikel
|
| 5 |
Compaction of IDDQ Test Sequence Using Reassignment Method
|
Maeda, Toshiyuki
|
|
2000
|
16 |
3 |
p. 243-249
|
artikel
|
| 6 |
Debug Facilities in the TriMedia CPU64 Architecture
|
Vranken, Harald
|
|
2000
|
16 |
3 |
p. 301-308
|
artikel
|
| 7 |
Deterministic BIST with Partial Scan
|
Kiefer, Gundolf
|
|
2000
|
16 |
3 |
p. 169-177
|
artikel
|
| 8 |
Editorial
|
Agrawal, Vishwani D.
|
|
2000
|
16 |
3 |
p. 163
|
artikel
|
| 9 |
Experimental Results on BIC Sensors for Transient Current Testing
|
Picos, R.
|
|
2000
|
16 |
3 |
p. 235-241
|
artikel
|
| 10 |
Extending Fault-Based Testing to Microelectromechanical Systems
|
Mir, S.
|
|
2000
|
16 |
3 |
p. 279-288
|
artikel
|
| 11 |
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
|
Raik, Jaan
|
|
2000
|
16 |
3 |
p. 213-226
|
artikel
|
| 12 |
Fault Simulation for Analog Circuits Under Parameter Variations
|
Khouas, Abdelhakim
|
|
2000
|
16 |
3 |
p. 269-278
|
artikel
|
| 13 |
Guest Editorial
|
Landrault, Christian
|
|
2000
|
16 |
3 |
p. 167
|
artikel
|
| 14 |
Low Power BIST by Filtering Non-Detecting Vectors
|
Manich, S.
|
|
2000
|
16 |
3 |
p. 193-202
|
artikel
|
| 15 |
Minimized Power Consumption for Scan-Based BIST
|
Gerstendörfer, Stefan
|
|
2000
|
16 |
3 |
p. 203-212
|
artikel
|
| 16 |
On Maximizing the Coverage of Catastrophic and Parametric Faults
|
Brosa, A.M.
|
|
2000
|
16 |
3 |
p. 251-258
|
artikel
|
| 17 |
On Random Pattern Testability of Cryptographic VLSI Cores
|
Schubert, A.
|
|
2000
|
16 |
3 |
p. 185-192
|
artikel
|
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