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16 results found

no	title	author	magazine	year	volume	issue	page(s)	type
1	A Heuristic Measure to Maximize Detected Faults per Test	Kim T. Le		1998	13	1	p. 57-60 4 p.	article
2	A Heuristic Measure to Maximize Detected Faults per Test	Le, Kim T.		1998	13	1	p. 57-60	article
3	A Totally Self-Checking 1-out-of-3 Code Error Indicator	A. Paschalis		1998	13	1	p. 61-66 6 p.	article
4	A Totally Self-Checking 1-out-of-3 Code Error Indicator	Paschalis, A.		1998	13	1	p. 61-66	article
5	Behavioral Level Noise Modeling and Jitter Simulation ofPhase-Locked Loops with Faults Using VHDL-AMS	Nihal J. Godambe		1998	13	1	p. 7-17 11 p.	article
6	Behavioral Level Noise Modeling and Jitter Simulation of Phase-Locked Loops with Faults Using VHDL-AMS	Godambe, Nihal J.		1998	13	1	p. 7-17	article
7	Editorial	Vishwani D. Agrawal		1998	13	1	p. 5-5 1 p.	article
8	Editorial	Agrawal, Vishwani D.		1998	13	1	p. 5	article
9	IDDT Testing versus IDDQ Testing	Yinghua Min		1998	13	1	p. 51-55 5 p.	article
10	IDDT Testing versus IDDQ Testing	Min, Yinghua		1998	13	1	p. 51-55	article
11	Layout Driven Selection and Chaining of Partial Scan Flip-Flops	Chau-Shen Chen		1998	13	1	p. 19-27 9 p.	article
12	Layout Driven Selection and Chaining of Partial Scan Flip-Flops	Chen, Chau-Shen		1998	13	1	p. 19-27	article
13	On-Chip Weighted Random Patterns	Jacob Savir		1998	13	1	p. 41-50 10 p.	article
14	On-Chip Weighted Random Patterns	Savir, Jacob		1998	13	1	p. 41-50	article
15	On-Line Error Detection for Bit-Serial Multipliers in GF(2m)	Sebastian Fenn		1998	13	1	p. 29-40 12 p.	article
16	On-Line Error Detection for Bit-Serial Multipliers in GF(2m)	Fenn, Sebastian		1998	13	1	p. 29-40	article

16 results found

Koninklijke Bibliotheek - National Library of the Netherlands