nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A Bist Scheme for Non-Volatile Memories
|
Olivo, Piero |
|
1998 |
12 |
1-2 |
p. 139-144 |
artikel |
2 |
A New Design Method for Self-Checking Unidirectional Combinational Circuits
|
Saposhnikov, V.V. |
|
1998 |
12 |
1-2 |
p. 41-53 |
artikel |
3 |
Clocked Dosimeter Compatible with Digital CMOS Technology
|
Garcia-Moreno, E. |
|
1998 |
12 |
1-2 |
p. 101-110 |
artikel |
4 |
Concurrent Delay Testing in Totally Self-Checking Systems
|
Paschalis, Antonis |
|
1998 |
12 |
1-2 |
p. 55-61 |
artikel |
5 |
Delivering Dependable Telecommunication Services Using Off-the-Shelf System Components
|
Levendel, Y. |
|
1998 |
12 |
1-2 |
p. 153-159 |
artikel |
6 |
Design of Self-Testing Checkers for m-out-of-n Codes Using Parallel Counters
|
Piestrak, Stanislaw J. |
|
1998 |
12 |
1-2 |
p. 63-68 |
artikel |
7 |
Editorial
|
Agrawal, Vishwani D. |
|
1998 |
12 |
1-2 |
p. 5 |
artikel |
8 |
Efficient Totally Self-Checking Shifter Design
|
Duarte, Ricardo O. |
|
1998 |
12 |
1-2 |
p. 29-39 |
artikel |
9 |
Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic Structures
|
Arabi, Karim |
|
1998 |
12 |
1-2 |
p. 93-99 |
artikel |
10 |
Mixed-Mode BIST Using Embedded Processors
|
Hellebrand, Sybille |
|
1998 |
12 |
1-2 |
p. 127-138 |
artikel |
11 |
On-Line Fault Monitoring
|
Stiffler, J.J. |
|
1998 |
12 |
1-2 |
p. 21-27 |
artikel |
12 |
On-Line Fault Resilience Through Gracefully Degradable ASICs
|
Orailoğlu, Alex |
|
1998 |
12 |
1-2 |
p. 145-151 |
artikel |
13 |
On-Line Testing for VLSI—A Compendium of Approaches
|
Nicolaidis, M. |
|
1998 |
12 |
1-2 |
p. 7-20 |
artikel |
14 |
Scalable Test Generators for High-Speed Datapath Circuits
|
Al-Asaad, Hussain |
|
1998 |
12 |
1-2 |
p. 111-125 |
artikel |
15 |
Self-Testing Embedded Two-Rail Checkers
|
Nikolos, Dimitris |
|
1998 |
12 |
1-2 |
p. 69-79 |
artikel |
16 |
Thermal Monitoring of Self-Checking Systems
|
Székely, V. |
|
1998 |
12 |
1-2 |
p. 81-92 |
artikel |