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Tijdschrift beschrijving
Alle jaargangen van het bijbehorende tijdschrift
Alle afleveringen van het bijbehorende jaargang
Alle artikelen van de bijbehorende aflevering
14 gevonden resultaten
| nr | titel | auteur | tijdschrift | jaar | jaarg. | afl. | pagina('s) | type |
| 1 | Determining Aliasing Probabilities in BIST by Counting Strings |
Rodrigue Byrne |
1997 |
11 | 3 |
p. 263-272 10 p. |
artikel |
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| 2 | Determining Aliasing Probabilities in BIST by Counting Strings |
Byrne, Rodrigue |
1997 |
11 | 3 |
p. 263-272 |
artikel |
|
| 3 | Distributed Test Pattern Generation for Stuck-At Faults in Sequential Circuits |
Peter A. Krauss |
1997 |
11 | 3 |
p. 227-245 19 p. |
artikel |
|
| 4 | Distributed Test Pattern Generation for Stuck-At Faults in Sequential Circuits |
Krauss, Peter A. |
1997 |
11 | 3 |
p. 227-245 |
artikel |
|
| 5 | Editorial |
Vishwani D. Agrawal |
1997 |
11 | 3 |
p. 195-195 1 p. |
artikel |
|
| 6 | Editorial |
Agrawal, Vishwani D. |
1997 |
11 | 3 |
p. 195 |
artikel |
|
| 7 | Failure Analysis of VLSI by I_DDQ Testing |
Steven Haehn |
1997 |
11 | 3 |
p. 273-283 11 p. |
artikel |
|
| 8 | Failure Analysis of VLSI by IDDQ Testing |
Haehn, Steven |
1997 |
11 | 3 |
p. 273-283 |
artikel |
|
| 9 | Multiple Experiment Environments for Testing |
Karen Panetta Lentz |
1997 |
11 | 3 |
p. 247-262 16 p. |
artikel |
|
| 10 | Multiple Experiment Environments for Testing |
Panetta Lentz, Karen |
1997 |
11 | 3 |
p. 247-262 |
artikel |
|
| 11 | Redundancy Removal during High-Level Synthesis Using Scheduling Dont-Cares |
Wayne Wolf |
1997 |
11 | 3 |
p. 211-225 15 p. |
artikel |
|
| 12 | Redundancy Removal during High-Level Synthesis Using Scheduling Don‘t-Cares |
Wolf, Wayne |
1997 |
11 | 3 |
p. 211-225 |
artikel |
|
| 13 | Testability Properties of Divergent Trees |
R.D. (Shawn) Blanton |
1997 |
11 | 3 |
p. 197-209 13 p. |
artikel |
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| 14 | Testability Properties of Divergent Trees |
Blanton, R.D. (Shawn) |
1997 |
11 | 3 |
p. 197-209 |
artikel |
14 gevonden resultaten