nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A Formalization of the IEEE 1149.1-1990 DiagnosticMethodology as Applied to Multichip Modules
|
Ken Posse |
|
1997 |
10 |
1 |
p. 119-125 7 p. |
artikel |
2 |
An Effective Multi-Chip BIST Scheme
|
Yervant Zorian |
|
1997 |
10 |
1 |
p. 87-95 9 p. |
artikel |
3 |
A Survey of Test Techniques for MCM Substrates
|
Madhavan Swaminathan |
|
1997 |
10 |
1 |
p. 27-38 12 p. |
artikel |
4 |
A Test Methodology for High Performance MCMs
|
Thomas M. Storey |
|
1997 |
10 |
1 |
p. 109-118 10 p. |
artikel |
5 |
Design-For-Test in a Multiple Substrate Multichip Module
|
Joel A. Jorgenson |
|
1997 |
10 |
1 |
p. 97-107 11 p. |
artikel |
6 |
Designing Dual Personality IEEE 1149.1 Compliant Multi-Chip Modules
|
Najmi Jarwala |
|
1997 |
10 |
1 |
p. 77-86 10 p. |
artikel |
7 |
Economic Analysis of Test Process Flows for Multichip ModulesUsing Known Good Die
|
Cynthia F. Murphy |
|
1997 |
10 |
1 |
p. 151-166 16 p. |
artikel |
8 |
Editorial
|
Vishwani D. Agrawal |
|
1997 |
10 |
1 |
p. 5-5 1 p. |
artikel |
9 |
Electron Beam ProbingA Solution for MCM Test and FailureAnalysis
|
R. Schmid |
|
1997 |
10 |
1 |
p. 55-63 9 p. |
artikel |
10 |
Fundamentals of MCM Testing and Design-for-Testability
|
Yervant Zorian |
|
1997 |
10 |
1 |
p. 7-14 8 p. |
artikel |
11 |
Guest Editorial
|
Yervant Zorian |
|
1997 |
10 |
1 |
p. 6-6 1 p. |
artikel |
12 |
Known Good Die
|
Larry Gilg |
|
1997 |
10 |
1 |
p. 15-25 11 p. |
artikel |
13 |
MCM Test Strategy Synthesis from Chip Test and Board TestApproaches
|
Andrew Flint |
|
1997 |
10 |
1 |
p. 65-76 12 p. |
artikel |
14 |
Multichip Module Diagnosis by Product-Code Signatures
|
P. Nagvajara |
|
1997 |
10 |
1 |
p. 127-136 10 p. |
artikel |
15 |
Simulation Techniques for the Manufacturing Test of MCMs
|
Mick Tegethoff |
|
1997 |
10 |
1 |
p. 137-149 13 p. |
artikel |
16 |
Smart Substrate MCMs
|
Anne E. Gattiker |
|
1997 |
10 |
1 |
p. 39-53 15 p. |
artikel |