nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A BIST Scheme for SNDR Testing of ΣΔ ADCs Using Sine-Wave Fitting
|
Rolíndez, Luis |
|
2006 |
|
4-6 |
p. 325-335 |
artikel |
2 |
A First Step for an INL Spectral-Based BIST: The Memory Optimization
|
Kerzérho, V. |
|
2006 |
|
4-6 |
p. 351-357 |
artikel |
3 |
A 1-MHz Area-Efficient On-Chip Spectrum Analyzer for Analog Testing
|
Domínguez, M. A. |
|
2006 |
|
4-6 |
p. 437-448 |
artikel |
4 |
Built-In-Self-Testing Techniques for Programmable Capacitor Arrays
|
Laknaur, Amit |
|
2006 |
|
4-6 |
p. 449-462 |
artikel |
5 |
Editorial
|
Agrawal, Vishwani D. |
|
2006 |
|
4-6 |
p. 307 |
artikel |
6 |
Embedded System Level Self-Test for Mixed-Signal IO Verification
|
Loukusa, V. |
|
2006 |
|
4-6 |
p. 463-470 |
artikel |
7 |
Guest Editorial
|
Mir, Salvador |
|
2006 |
|
4-6 |
p. 311 |
artikel |
8 |
Investigation into the Use of Hybrid Solutions for ΣΔ A/D Converter Testing
|
Georgopoulos, K. |
|
2006 |
|
4-6 |
p. 359-370 |
artikel |
9 |
Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects
|
Xuan, Xiangdong |
|
2006 |
|
4-6 |
p. 471-482 |
artikel |
10 |
Next Generation ADC Massive Parallel Testing with Real Time Parameter Evaluation
|
Mattes, Heinz |
|
2006 |
|
4-6 |
p. 337-350 |
artikel |
11 |
On-Chip Random Jitter Testing Using Low Tap-Count Coarse Delay Lines
|
Huang, Jiun-Lang |
|
2006 |
|
4-6 |
p. 387-398 |
artikel |
12 |
Proposal of Fault Diagnosis of Analog Circuits by Combining Operation-Region Model and X–Y Zoning Method: Case Study
|
Miura, Yukiya |
|
2006 |
|
4-6 |
p. 411-423 |
artikel |
13 |
Structural Fault Modeling and Fault Detection Through Neyman–Pearson Decision Criteria for Analog Integrated Circuits
|
Zjajo, Amir |
|
2006 |
|
4-6 |
p. 399-409 |
artikel |
14 |
TBSA: Threshold-Based Simulation Accuracy Method for Fast Analog DC Fault Simulation
|
Morneau, Michel |
|
2006 |
|
4-6 |
p. 425-436 |
artikel |
15 |
Test Development Through Defect and Test Escape Level Estimation for Data Converters
|
Wegener, Carsten |
|
2006 |
|
4-6 |
p. 313-324 |
artikel |
16 |
Test Technology Newsletter
|
|
|
2006 |
|
4-6 |
p. 309-310 |
artikel |
17 |
Towards Fault-Tolerant RF Front Ends
|
Das, Tejasvi |
|
2006 |
|
4-6 |
p. 371-386 |
artikel |