| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Built-in-Self-Test Σ-Δ ADC Prototype
|
Hong, Hao-Chiao
|
|
2009
|
|
2-3 |
p. 145-156
|
artikel
|
| 2 |
A Built-in-Self-Test Σ-Δ ADC Prototype
|
Hong, Hao-Chiao
|
|
|
|
2-3 |
p. 145-156
|
artikel
|
| 3 |
A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology
|
Brown, Jason G.
|
|
2007
|
|
2-3 |
p. 131-144
|
artikel
|
| 4 |
A New Algorithm for the Selection of Control Cells in Boundary-Scan Interconnect Test
|
Quiros-Olozabal, A.
|
|
2008
|
|
2-3 |
p. 187-195
|
artikel
|
| 5 |
A Novel Fault Localization Technique Based on Deconvolution and Calibration of Power Pad Transients Signals
|
Rad, Reza M.
|
|
2008
|
|
2-3 |
p. 169-185
|
artikel
|
| 6 |
A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlash
|
Ginez, O.
|
|
2008
|
|
2-3 |
p. 127-144
|
artikel
|
| 7 |
Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics
|
Wang, Zhanglei
|
|
2007
|
|
2-3 |
p. 145-161
|
artikel
|
| 8 |
Cellular Array-based Delay-insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems
|
Di, Jia
|
|
2007
|
|
2-3 |
p. 175-192
|
artikel
|
| 9 |
Defect-tolerant Logic with Nanoscale Crossbar Circuits
|
Hogg, Tad
|
|
2007
|
|
2-3 |
p. 117-129
|
artikel
|
| 10 |
Designing Nanoscale Logic Circuits Based on Markov Random Fields
|
Nepal, K.
|
|
2007
|
|
2-3 |
p. 255-266
|
artikel
|
| 11 |
Editorial
|
Agrawal, Vishwani D.
|
|
2007
|
|
2-3 |
p. 111
|
artikel
|
| 12 |
Guest Editorial
|
Tehranipoor, Mohammad
|
|
2007
|
|
2-3 |
p. 115-116
|
artikel
|
| 13 |
On the Tolerance to Manufacturing Defects in Molecular QCA Tiles for Processing-by-wire
|
Huang, Jing
|
|
2007
|
|
2-3 |
p. 163-174
|
artikel
|
| 14 |
QCA Circuits for Robust Coplanar Crossing
|
Bhanja, Sanjukta
|
|
2007
|
|
2-3 |
p. 193-210
|
artikel
|
| 15 |
Reliability and Defect Tolerance in Metallic Quantum-dot Cellular Automata
|
Liu, Mo
|
|
2007
|
|
2-3 |
p. 211-218
|
artikel
|
| 16 |
Soft Error Rate Reduction Using Circuit Optimization and Transient Filter Insertion
|
Choudhury, Mihir R.
|
|
2009
|
|
2-3 |
p. 197-207
|
artikel
|
| 17 |
Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips
|
Su, Fei
|
|
2007
|
|
2-3 |
p. 219-233
|
artikel
|
| 18 |
Test Points Selection for Analog Fault Dictionary Techniques
|
Yang, Chenglin
|
|
2009
|
|
2-3 |
p. 157-168
|
artikel
|
| 19 |
Test Technology Newsletter April 2007
|
Kim, Bruce
|
|
2007
|
|
2-3 |
p. 113-114
|
artikel
|
| 20 |
Towards Nanoelectronics Processor Architectures
|
Rao, Wenjing
|
|
2007
|
|
2-3 |
p. 235-254
|
artikel
|
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