nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A Landauer Approach to Nanoscale MOSFETs
|
M. Lundstrom |
|
2002 |
1 |
4 |
p. 481-489 9 p. |
artikel |
2 |
A Landauer Approach to Nanoscale MOSFETs
|
Lundstrom, M. |
|
2002 |
1 |
4 |
p. 481-489 |
artikel |
3 |
Anisotropic Quantum Dots
|
J.B. Wang |
|
2002 |
1 |
4 |
p. 491-501 11 p. |
artikel |
4 |
Anisotropic Quantum Dots
|
Wang, J.B. |
|
2002 |
1 |
4 |
p. 491-501 |
artikel |
5 |
Editorial
|
D.K. Ferry |
|
2002 |
1 |
4 |
p. 451-451 1 p. |
artikel |
6 |
Editorial
|
Ferry, D.K. |
|
2002 |
1 |
4 |
p. 451 |
artikel |
7 |
Fullband Particle-Based Simulation of High-Field Transient Transport in IIIV Semiconductors
|
S. Wigger |
|
2002 |
1 |
4 |
p. 475-480 6 p. |
artikel |
8 |
Fullband Particle-Based Simulation of High-Field Transient Transport in III–V Semiconductors
|
Wigger, S. |
|
2002 |
1 |
4 |
p. 475-480 |
artikel |
9 |
Molecular Conduction Paradigms and Possibilities
|
A.W. Ghosh |
|
2002 |
1 |
4 |
p. 515-525 11 p. |
artikel |
10 |
Molecular Conduction: Paradigms and Possibilities
|
Ghosh, A.W. |
|
2002 |
1 |
4 |
p. 515-525 |
artikel |
11 |
Study of Electron Transport in SOI MOSFETs Using Monte Carlo Technique with Full-Band Modeling
|
H. Takeda |
|
2002 |
1 |
4 |
p. 467-474 8 p. |
artikel |
12 |
Study of Electron Transport in SOI MOSFETs Using Monte Carlo Technique with Full-Band Modeling
|
Takeda, H. |
|
2002 |
1 |
4 |
p. 467-474 |
artikel |
13 |
The Role of Quantization Effects on the Operation of 50 nm MOSFETs, 250 nm FIBMOS Devices and Narrow-Width SOI Device Structures
|
D. Vasileska |
|
2002 |
1 |
4 |
p. 453-465 13 p. |
artikel |
14 |
The Role of Quantization Effects on the Operation of 50 nm MOSFETs, 250 nm FIBMOS Devices and Narrow-Width SOI Device Structures
|
Vasileska, D. |
|
2002 |
1 |
4 |
p. 453-465 |
artikel |
15 |
The Use of Quantum Potentials for Confinement and Tunnelling in Semiconductor Devices
|
A. Asenov |
|
2002 |
1 |
4 |
p. 503-513 11 p. |
artikel |
16 |
The Use of Quantum Potentials for Confinement and Tunnelling in Semiconductor Devices
|
Asenov, A. |
|
2002 |
1 |
4 |
p. 503-513 |
artikel |