| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accounting of multicharged ions in the quantitative analysis of a substance on an ЭMAΛ-2 mass analyzer
|
Bykovskii, Yu. A.
|
|
|
43 |
4 |
p. 562-563
|
artikel
|
| 2 |
A control system for the 3-mm-wavelength band spectral radiometer
|
Shkelev, E. I.
|
|
|
43 |
4 |
p. 493-499
|
artikel
|
| 3 |
A device for sublimation molecular beam deposition of erbium-doped silicon films
|
Svetlov, S. P.
|
|
|
43 |
4 |
p. 564-565
|
artikel
|
| 4 |
A grid-type semitransparent X-ray monochromator
|
Touryanskii, A. G.
|
|
|
43 |
4 |
p. 542-546
|
artikel
|
| 5 |
A high-current picosecond electron accelerator with a low-impedance vacuum diode
|
Zheltov, K. A.
|
|
|
43 |
4 |
p. 552-555
|
artikel
|
| 6 |
A 400-keV X-ray generator with the pulse duration variable within 10–80 ns and an up to 70-Gy radiation dose
|
Gerasimov, A. I.
|
|
|
43 |
4 |
p. 517-522
|
artikel
|
| 7 |
A microtron cavity with a shifted cathode for operation in the second-type acceleration mode
|
Bogomolov, G. D.
|
|
|
43 |
4 |
p. 523-527
|
artikel
|
| 8 |
A multichannel pulse integrator for a Mössbauer spectrometer
|
Sinyavskii, V. I.
|
|
|
43 |
4 |
p. 500-503
|
artikel
|
| 9 |
A nanosecond light source for scintillation-and Cerenkov-detector calibration
|
Vasil'ev, R. V.
|
|
|
43 |
4 |
p. 570-572
|
artikel
|
| 10 |
An automated device for manufacturing microneedles of iterated shape
|
Zaitsev, S. V.
|
|
|
43 |
4 |
p. 566-569
|
artikel
|
| 11 |
A new type of plastic scintillators with excellent radiation resistance
|
Bol’bit, N. M.
|
|
|
43 |
4 |
p. 460-464
|
artikel
|
| 12 |
An installation for studying the magnetoelectric effect
|
Milov, V. N.
|
|
|
43 |
4 |
p. 556-559
|
artikel
|
| 13 |
A power supply for a technological installation
|
Red'ko, V. V.
|
|
|
43 |
4 |
p. 576-579
|
artikel
|
| 14 |
A spectrometer for the study of angular correlations in polarized-orthopositronium decay
|
Andrukhovich, S. K.
|
|
|
43 |
4 |
p. 453-459
|
artikel
|
| 15 |
A subnanosecond pulsed source of electrons and X-rays
|
Loiko, T. V.
|
|
|
43 |
4 |
p. 514-516
|
artikel
|
| 16 |
A temperature stabilization system for diode lasers
|
Vasil'ev, V. A.
|
|
|
43 |
4 |
p. 580-581
|
artikel
|
| 17 |
A time-of-flight measurement system for the HADES wide-aperture dielectron spectrometer
|
Rabin, N. V.
|
|
|
43 |
4 |
p. 435-452
|
artikel
|
| 18 |
Characteristics and behavior of the electron beam of the MиH-1 accelerator in air
|
Babich, L. P.
|
|
|
43 |
4 |
p. 510-513
|
artikel
|
| 19 |
Measurement of the plasma electron temperature with microsecond resolution
|
Bugrova, A. I.
|
|
|
43 |
4 |
p. 528-531
|
artikel
|
| 20 |
Measuring the local density of light gases by characteristic X-rays
|
Kuznetsov, L. I.
|
|
|
43 |
4 |
p. 537-541
|
artikel
|
| 21 |
Multiplication mechanism in open-type continuous-dynode electron multipliers
|
Marrsin, B. V.
|
|
|
43 |
4 |
p. 506-509
|
artikel
|
| 22 |
On the laser calibration of charged particle detectors
|
Gushchin, E. M.
|
|
|
43 |
4 |
p. 470-480
|
artikel
|
| 23 |
Parameters of charged-particle tracks in the P-type nuclear emulsion
|
Aleshin, Yu. D.
|
|
|
43 |
4 |
p. 465-469
|
artikel
|
| 24 |
Precision control of semiconductor lasers
|
Efimov, A. S.
|
|
|
43 |
4 |
p. 532-536
|
artikel
|
| 25 |
Pulsed interferometric calorimetry
|
Magunov, A. N.
|
|
|
43 |
4 |
p. 582-584
|
artikel
|
| 26 |
Quasi-differentiation method for forming anti-Compton γ-ray spectra
|
Morozov, V. A.
|
|
|
43 |
4 |
p. 481-485
|
artikel
|
| 27 |
Radiation monitoring with semiconductor spectrometers-dosimeters
|
Mineev, Yu. V.
|
|
|
43 |
4 |
p. 547-551
|
artikel
|
| 28 |
Reconstruction of the parameters of a soft X-radiation spectrum from signals of vacuum X-ray diodes
|
Branitskii, A. V.
|
|
|
43 |
4 |
p. 486-492
|
artikel
|
| 29 |
Spectral sensitivity of the YΦ-4 photographic film in the 0.27–3-keV range
|
Bessarab, A. V.
|
|
|
43 |
4 |
p. 573-575
|
artikel
|
| 30 |
Universal microprocessor interlock system
|
Kochenda, L. M.
|
|
|
43 |
4 |
p. 504-505
|
artikel
|
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