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                             12 results found
no title author magazine year volume issue page(s) type
1 An Integrated CAD Methodology for Yield Enhancement of VLSI CMOS Circuits Including Statistical Device Variations Massimo Conti
2003
37 2 p. 85-102
18 p.
article
2 An Integrated CAD Methodology for Yield Enhancement of VLSI CMOS Circuits Including Statistical Device Variations Conti, Massimo
2003
37 2 p. 85-102
article
3 Area Allocation Strategies for Enhancing Yield of R-2R Ladders Yu Lin
2003
37 2 p. 123-132
10 p.
article
4 Area Allocation Strategies for Enhancing Yield of R-2R Ladders Lin, Yu
2003
37 2 p. 123-132
article
5 A Strategy for Rapid Mismatch Evaluation of Transient Characteristics of CMOS Analog Cells Rafael López-Ahumada
2003
37 2 p. 103-111
9 p.
article
6 A Strategy for Rapid Mismatch Evaluation of Transient Characteristics of CMOS Analog Cells López-Ahumada, Rafael
2003
37 2 p. 103-111
article
7 Guest Editorial Electronic Design for Quality Tuna B. Tarim
2003
37 2 p. 71-71
1 p.
article
8 Guest Editorial: Electronic Design for Quality Tarim, Tuna B.
2003
37 2 p. 71
article
9 Mismatch-Induced Trade-Offs and Scalability of Analog Preprocessing Visual Microprocessor Chips A. Rodríguez-Vázquez
2003
37 2 p. 73-83
11 p.
article
10 Mismatch-Induced Trade-Offs and Scalability of Analog Preprocessing Visual Microprocessor Chips Rodríguez-Vázquez, A.
2003
37 2 p. 73-83
article
11 Regression Criteria and Their Application in Different Modeling Cases Georges Gielen
2003
37 2 p. 113-122
10 p.
article
12 Regression Criteria and Their Application in Different Modeling Cases Gielen, Georges
2003
37 2 p. 113-122
article
                             12 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands