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12 results found

no	title	author	magazine	year	volume	issue	page(s)	type
1	An Integrated CAD Methodology for Yield Enhancement of VLSI CMOS Circuits Including Statistical Device Variations	Massimo Conti		2003	37	2	p. 85-102 18 p.	article
2	An Integrated CAD Methodology for Yield Enhancement of VLSI CMOS Circuits Including Statistical Device Variations	Conti, Massimo		2003	37	2	p. 85-102	article
3	Area Allocation Strategies for Enhancing Yield of R-2R Ladders	Yu Lin		2003	37	2	p. 123-132 10 p.	article
4	Area Allocation Strategies for Enhancing Yield of R-2R Ladders	Lin, Yu		2003	37	2	p. 123-132	article
5	A Strategy for Rapid Mismatch Evaluation of Transient Characteristics of CMOS Analog Cells	Rafael López-Ahumada		2003	37	2	p. 103-111 9 p.	article
6	A Strategy for Rapid Mismatch Evaluation of Transient Characteristics of CMOS Analog Cells	López-Ahumada, Rafael		2003	37	2	p. 103-111	article
7	Guest Editorial Electronic Design for Quality	Tuna B. Tarim		2003	37	2	p. 71-71 1 p.	article
8	Guest Editorial: Electronic Design for Quality	Tarim, Tuna B.		2003	37	2	p. 71	article
9	Mismatch-Induced Trade-Offs and Scalability of Analog Preprocessing Visual Microprocessor Chips	A. Rodríguez-Vázquez		2003	37	2	p. 73-83 11 p.	article
10	Mismatch-Induced Trade-Offs and Scalability of Analog Preprocessing Visual Microprocessor Chips	Rodríguez-Vázquez, A.		2003	37	2	p. 73-83	article
11	Regression Criteria and Their Application in Different Modeling Cases	Georges Gielen		2003	37	2	p. 113-122 10 p.	article
12	Regression Criteria and Their Application in Different Modeling Cases	Gielen, Georges		2003	37	2	p. 113-122	article

12 results found

Koninklijke Bibliotheek - National Library of the Netherlands