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Journal description
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12 results found
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title
author
magazine
year
volume
issue
page(s)
type
1
An Integrated CAD Methodology for Yield Enhancement of VLSI CMOS Circuits Including Statistical Device Variations
Massimo Conti
2003
37
2
p. 85-102
18 p.
article
2
An Integrated CAD Methodology for Yield Enhancement of VLSI CMOS Circuits Including Statistical Device Variations
Conti, Massimo
2003
37
2
p. 85-102
article
3
Area Allocation Strategies for Enhancing Yield of R-2R Ladders
Yu Lin
2003
37
2
p. 123-132
10 p.
article
4
Area Allocation Strategies for Enhancing Yield of R-2R Ladders
Lin, Yu
2003
37
2
p. 123-132
article
5
A Strategy for Rapid Mismatch Evaluation of Transient Characteristics of CMOS Analog Cells
Rafael López-Ahumada
2003
37
2
p. 103-111
9 p.
article
6
A Strategy for Rapid Mismatch Evaluation of Transient Characteristics of CMOS Analog Cells
López-Ahumada, Rafael
2003
37
2
p. 103-111
article
7
Guest Editorial Electronic Design for Quality
Tuna B. Tarim
2003
37
2
p. 71-71
1 p.
article
8
Guest Editorial: Electronic Design for Quality
Tarim, Tuna B.
2003
37
2
p. 71
article
9
Mismatch-Induced Trade-Offs and Scalability of Analog Preprocessing Visual Microprocessor Chips
A. Rodríguez-Vázquez
2003
37
2
p. 73-83
11 p.
article
10
Mismatch-Induced Trade-Offs and Scalability of Analog Preprocessing Visual Microprocessor Chips
Rodríguez-Vázquez, A.
2003
37
2
p. 73-83
article
11
Regression Criteria and Their Application in Different Modeling Cases
Georges Gielen
2003
37
2
p. 113-122
10 p.
article
12
Regression Criteria and Their Application in Different Modeling Cases
Gielen, Georges
2003
37
2
p. 113-122
article
12 results found
Koninklijke Bibliotheek -
National Library of the Netherlands