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                             14 results found
no title author magazine year volume issue page(s) type
1 A convenient method for determining the rotational relationship between the electron image and the diffraction pattern Moreen, H.A.
1970
3 2 p. 225-228
4 p.
article
2 A method for obtaining quantitative dilatometric data from alloys undergoing a phase transformation Fisher, G.L.
1970
3 2 p. 229-233
5 p.
article
3 A technique for thinning deposited films on fine wire for transmission electron microscopy Sanwald, R.C.
1970
3 2 p. 221-224
4 p.
article
4 Books: A selected list Cochran, F.L.
1970
3 2 p. 239-240
2 p.
article
5 Contact microradiography in the study of alloys Davis, A.M
1970
3 2 p. 165-182
18 p.
article
6 Dislocation etch pits on basal, prismatic, and pyramidal planes of single-crystal beryllium oxide Digiallonardo, S.L.
1970
3 2 p. 215-217
3 p.
article
7 Metallographic applications of xenon illumination systems Gray, R.J
1970
3 2 p. 135-145
11 p.
article
8 Metallographic preparation of two-phase titanium alloys for replica electron microscopy Fopiano, P.J.
1970
3 2 p. 209-213
5 p.
article
9 The kinetic behavior of precipitate particles under Ostwald ripening conditions Markworth, Alan J
1970
3 2 p. 197-208
12 p.
article
10 The measurement of silicon particle size distribution in rolled aluminum-silicon eutectic using an extraction technique Chappell, R.S.
1970
3 2 p. 235-237
3 p.
article
11 The observation of grain structure in evaporated aluminum films by electropolishing and chemical etching Das, G
1970
3 2 p. 155-164
10 p.
article
12 The use of the electron microprobe for measuring air contamination in Ti:6Al-4V Olsen, R.H
1970
3 2 p. 183-195
13 p.
article
13 The utility of calculated intensities for the indexing of powder patterns Wolten, G.M.
1970
3 2 p. 219-220
2 p.
article
14 Thin-foil preparation of refractory materials Hannink, R.H.J
1970
3 2 p. 147-154
8 p.
article
                             14 results found
 
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