nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A duoplasmatron ion source for solid materials such as As and P
|
Zhong Bo-Li, |
|
1981 |
189 |
1 |
p. 335-339 5 p. |
artikel |
2 |
Advances in molten metal field ion sources
|
Clampitt, R. |
|
1981 |
189 |
1 |
p. 111-116 6 p. |
artikel |
3 |
A high-throughput mechanically scanned target chamber
|
Ryding, G. |
|
1981 |
189 |
1 |
p. 319-325 7 p. |
artikel |
4 |
A medium energy facility for variable temperature implantation and analysis
|
Chaumont, Jacques |
|
1981 |
189 |
1 |
p. 193-198 6 p. |
artikel |
5 |
A microprocessor-based beam sweep control unit
|
Conrad, R. |
|
1981 |
189 |
1 |
p. 275-280 6 p. |
artikel |
6 |
A new dose control technique for ion implantation
|
Ryding, G. |
|
1981 |
189 |
1 |
p. 295-303 9 p. |
artikel |
7 |
An ion accelerator facility for the preparation of nuclear bombardment targets
|
Grime, G.W. |
|
1981 |
189 |
1 |
p. 199-203 5 p. |
artikel |
8 |
Aspects of the physics, chemistry, and technology of high intensity heavy ion sources
|
Alton, G.D. |
|
1981 |
189 |
1 |
p. 15-42 28 p. |
artikel |
9 |
Beam optics design for ion implantation
|
Keller, J.H. |
|
1981 |
189 |
1 |
p. 7-14 8 p. |
artikel |
10 |
Comparison between properties of steels implanted with unseparated ions and a selected ion
|
Iwaki, Masaya |
|
1981 |
189 |
1 |
p. 155-159 5 p. |
artikel |
11 |
Control techniques for a high current ion implantation system
|
Bayer, Erich H. |
|
1981 |
189 |
1 |
p. 183-186 4 p. |
artikel |
12 |
Correlation between electrostatic scan pattern and local dose nonuniformities
|
Glawischnig, H. |
|
1981 |
189 |
1 |
p. 291-294 4 p. |
artikel |
13 |
Cryostat for ion implantation into insulators at low temperatures
|
Rössler, Kurt |
|
1981 |
189 |
1 |
p. 141-144 4 p. |
artikel |
14 |
Design and fabrication of a simulation chamber
|
Kumar Agrawal, Satyendra |
|
1981 |
189 |
1 |
p. 331-333 3 p. |
artikel |
15 |
Dosimetry measurement in ion implanters
|
Jamba, Douglas M. |
|
1981 |
189 |
1 |
p. 253-263 11 p. |
artikel |
16 |
Editorial
|
McKenna, Charles M. |
|
1981 |
189 |
1 |
p. vii-ix nvt p. |
artikel |
17 |
Editorial Board
|
|
|
1981 |
189 |
1 |
p. ii- 1 p. |
artikel |
18 |
Electrical rotation of quadrupole lenses
|
Martin, F.W. |
|
1981 |
189 |
1 |
p. 93-96 4 p. |
artikel |
19 |
Electromagnetic scanning systems
|
Hanley, Peter R. |
|
1981 |
189 |
1 |
p. 227-237 11 p. |
artikel |
20 |
Electrostatic ion optics and beam transport for ion implantation
|
Larson, J.D. |
|
1981 |
189 |
1 |
p. 71-91 21 p. |
artikel |
21 |
Equipment for accurate ion collection of high areal uniformity
|
Gries, W.H. |
|
1981 |
189 |
1 |
p. 287-290 4 p. |
artikel |
22 |
Experiments on gas cooling of wafers
|
King, Monty |
|
1981 |
189 |
1 |
p. 169-173 5 p. |
artikel |
23 |
Fast target heating system for ion implantation
|
Kräutle, H. |
|
1981 |
189 |
1 |
p. 151-154 4 p. |
artikel |
24 |
First results with ELSIRE — a reflex ion source for singly charged heavy ions
|
Keller, Roderich |
|
1981 |
189 |
1 |
p. 97-101 5 p. |
artikel |
25 |
Historical perspective and future trends for ion implantation systems
|
Wegmann, Lienhard |
|
1981 |
189 |
1 |
p. 1-6 6 p. |
artikel |
26 |
Improved uniformity of implanted dose by a compensated scan pattern generator
|
Turner, N. |
|
1981 |
189 |
1 |
p. 311-318 8 p. |
artikel |
27 |
In situ implantation system in argonne national laboratory hvem-tandem facility
|
Taylor, Anthony |
|
1981 |
189 |
1 |
p. 211-217 7 p. |
artikel |
28 |
Ion extraction and optics arithmetic
|
Whealton, J.H. |
|
1981 |
189 |
1 |
p. 55-70 16 p. |
artikel |
29 |
Ion implantation in semiconductor processing
|
Namba, Susumu |
|
1981 |
189 |
1 |
p. 175-182 8 p. |
artikel |
30 |
Low cost molecular ion implantation equipment
|
Muller, J.C. |
|
1981 |
189 |
1 |
p. 205-210 6 p. |
artikel |
31 |
Low temperature irradiation equipment for measurements down to 150 mK
|
Bauriedl, W. |
|
1981 |
189 |
1 |
p. 145-150 6 p. |
artikel |
32 |
Magnet optics for beam transport
|
Glavish, H.F. |
|
1981 |
189 |
1 |
p. 43-53 11 p. |
artikel |
33 |
Manufacturing advantages for remote control of medium current ion implant systems
|
Marsh, R.L. |
|
1981 |
189 |
1 |
p. 187-191 5 p. |
artikel |
34 |
New techniques of implantation for near-term applications
|
Bruel, M. |
|
1981 |
189 |
1 |
p. 135-140 6 p. |
artikel |
35 |
Optimal selection of sweep frequencies in ion implantation systems with X-Y scanning
|
Rogers, Edwin J. |
|
1981 |
189 |
1 |
p. 305-310 6 p. |
artikel |
36 |
Post-implant methods for characterizing the doping uniformity and dose accuracy of ion implantation equipment
|
Gan, J.N. |
|
1981 |
189 |
1 |
p. 265-274 10 p. |
artikel |
37 |
Production of high-current metal ion beams
|
Hirvonen, J.K. |
|
1981 |
189 |
1 |
p. 103-106 4 p. |
artikel |
38 |
Pulsed CV system for ion implantation control
|
Schmid, G.E. |
|
1981 |
189 |
1 |
p. 219-225 7 p. |
artikel |
39 |
Some considerations on target chamber design
|
Stocker, Rudolf J. |
|
1981 |
189 |
1 |
p. 281-286 6 p. |
artikel |
40 |
Stimulation of low energy (shallow) implants using target tilt
|
Beanland, D.G. |
|
1981 |
189 |
1 |
p. 133- 1 p. |
artikel |
41 |
Target chambers for ion implantation using mechanical scanning
|
Ryding, G. |
|
1981 |
189 |
1 |
p. 239-251 13 p. |
artikel |
42 |
Techniques and equipment for non-semiconductor applications of ion implantation
|
Dearnaley, G. |
|
1981 |
189 |
1 |
p. 117-132 16 p. |
artikel |
43 |
Technique to study simultaneous deposition and ion implantation
|
Naujokaitis, R. |
|
1981 |
189 |
1 |
p. 327-329 3 p. |
artikel |
44 |
The Frankfurt PIG ion source
|
Baumann, H. |
|
1981 |
189 |
1 |
p. 107-110 4 p. |
artikel |
45 |
The influence of ion implantation parameters on the surface modification of steels
|
Goode, P.D. |
|
1981 |
189 |
1 |
p. 161-168 8 p. |
artikel |