nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Advances in X-ray analysis: Volume 26
|
Sullivan, R.A.L. |
|
1984 |
8 |
1-2 |
p. iv- 1 p. |
artikel |
2 |
Biological mineralization and demineralization
|
Underwood, F.A. |
|
1984 |
8 |
1-2 |
p. iii- 1 p. |
artikel |
3 |
Chapter 5 Analysis by heavy ion induced X-ray emission
|
Heitz, Ch. |
|
1984 |
8 |
1-2 |
p. 131-150 20 p. |
artikel |
4 |
Chapter 8 Analysis of electronic and solar grade silicon by atomic emission spectroscopy from inductively coupled plasma
|
Morvan, D. |
|
1984 |
8 |
1-2 |
p. 175-180 6 p. |
artikel |
5 |
Chapter 7 Application of neutron activation analysis to silicon characterization
|
Revel, Gilles |
|
1984 |
8 |
1-2 |
p. 167-173 7 p. |
artikel |
6 |
Chapter 4 Determination of impurities in silicon by activation analyses using charged particle accelerators
|
Debrun, J.L. |
|
1984 |
8 |
1-2 |
p. 115-129 15 p. |
artikel |
7 |
Chapter 3 Low energy ion scattering spectrometry
|
Grob, J.J. |
|
1984 |
8 |
1-2 |
p. 107-114 8 p. |
artikel |
8 |
Chapter 2 Rutherford Backscattering Spectroscopy (R.B.S.)
|
Grob, J.J. |
|
1984 |
8 |
1-2 |
p. 59-106 48 p. |
artikel |
9 |
Chapter 1 Secondary Ion Mass Spectrometry (S.I.M.S.)
|
Stuck, R. |
|
1984 |
8 |
1-2 |
p. 11-57 47 p. |
artikel |
10 |
Chapter 6 Spark source mass spectrometry analysis — Its application to polycrystalline solar grade silicon
|
Lasne, C. |
|
1984 |
8 |
1-2 |
p. 151-165 15 p. |
artikel |
11 |
Characterization of silicon by ion beam techniques
|
|
|
1984 |
8 |
1-2 |
p. 1- 1 p. |
artikel |
12 |
Characterization of silicon by ion beam techniques
|
Siffert, P. |
|
1984 |
8 |
1-2 |
p. 3-9 7 p. |
artikel |
13 |
Conclusion
|
|
|
1984 |
8 |
1-2 |
p. 181-187 7 p. |
artikel |
14 |
Editorial Board
|
|
|
1984 |
8 |
1-2 |
p. IFC- 1 p. |
artikel |
15 |
Editorial The future of crystal growth and characterization
|
Pamplin, Brian |
|
1984 |
8 |
1-2 |
p. i-ii nvt p. |
artikel |