| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Advances in X-ray analysis: Volume 26
|
Sullivan, R.A.L.
|
|
1984
|
8 |
1-2 |
p. iv-
1 p.
|
artikel
|
| 2 |
Biological mineralization and demineralization
|
Underwood, F.A.
|
|
1984
|
8 |
1-2 |
p. iii-
1 p.
|
artikel
|
| 3 |
Chapter 5 Analysis by heavy ion induced X-ray emission
|
Heitz, Ch.
|
|
1984
|
8 |
1-2 |
p. 131-150
20 p.
|
artikel
|
| 4 |
Chapter 8 Analysis of electronic and solar grade silicon by atomic emission spectroscopy from inductively coupled plasma
|
Morvan, D.
|
|
1984
|
8 |
1-2 |
p. 175-180
6 p.
|
artikel
|
| 5 |
Chapter 7 Application of neutron activation analysis to silicon characterization
|
Revel, Gilles
|
|
1984
|
8 |
1-2 |
p. 167-173
7 p.
|
artikel
|
| 6 |
Chapter 4 Determination of impurities in silicon by activation analyses using charged particle accelerators
|
Debrun, J.L.
|
|
1984
|
8 |
1-2 |
p. 115-129
15 p.
|
artikel
|
| 7 |
Chapter 3 Low energy ion scattering spectrometry
|
Grob, J.J.
|
|
1984
|
8 |
1-2 |
p. 107-114
8 p.
|
artikel
|
| 8 |
Chapter 2 Rutherford Backscattering Spectroscopy (R.B.S.)
|
Grob, J.J.
|
|
1984
|
8 |
1-2 |
p. 59-106
48 p.
|
artikel
|
| 9 |
Chapter 1 Secondary Ion Mass Spectrometry (S.I.M.S.)
|
Stuck, R.
|
|
1984
|
8 |
1-2 |
p. 11-57
47 p.
|
artikel
|
| 10 |
Chapter 6 Spark source mass spectrometry analysis — Its application to polycrystalline solar grade silicon
|
Lasne, C.
|
|
1984
|
8 |
1-2 |
p. 151-165
15 p.
|
artikel
|
| 11 |
Characterization of silicon by ion beam techniques
|
|
|
1984
|
8 |
1-2 |
p. 1-
1 p.
|
artikel
|
| 12 |
Characterization of silicon by ion beam techniques
|
Siffert, P.
|
|
1984
|
8 |
1-2 |
p. 3-9
7 p.
|
artikel
|
| 13 |
Conclusion
|
|
|
1984
|
8 |
1-2 |
p. 181-187
7 p.
|
artikel
|
| 14 |
Editorial Board
|
|
|
1984
|
8 |
1-2 |
p. IFC-
1 p.
|
artikel
|
| 15 |
Editorial The future of crystal growth and characterization
|
Pamplin, Brian
|
|
1984
|
8 |
1-2 |
p. i-ii
nvt p.
|
artikel
|
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