nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Comparison of GaAs grown on standard Si (511) and compliant SOI (511)
|
Seaford, M. L. |
|
2000 |
29 |
7 |
p. 906-908 |
artikel |
2 |
Comparison of InGaSb/InAs superlattice structures grown by MBE on GaSb, GaAs, and compliant GaAs substrates
|
Tomich, D. H. |
|
2000 |
29 |
7 |
p. 940-943 |
artikel |
3 |
Complex permeability studies of Li1+ substituted Cu-Zn ferrites
|
Suryavanshi, S. S. |
|
2000 |
29 |
7 |
p. 979-983 |
artikel |
4 |
Compliant substrates: A comparative study of the relaxation mechanisms of strained films bonded to high and low viscosity oxides
|
Hobart, K. D. |
|
2000 |
29 |
7 |
p. 897-900 |
artikel |
5 |
Engineering phase formation thermo-chemistry for crystal growth of homogeneous ternary and quaternary III–V compound semiconductors from melts
|
Dutta, P. S. |
|
2000 |
29 |
7 |
p. 956-963 |
artikel |
6 |
Er-doped polycrystalline silicon for light emission at λ=1.54 µm
|
Chen, Thomas D. |
|
2000 |
29 |
7 |
p. 973-978 |
artikel |
7 |
Foreword
|
Seaford, Matthew L. |
|
2000 |
29 |
7 |
p. 893 |
artikel |
8 |
Identification of prismatic slip bands in 4H SiC boules grown by physical vapor transport
|
Ha, Seoyong |
|
2000 |
29 |
7 |
p. L5-L8 |
artikel |
9 |
Lattice-mismatched InGaAs layers grown by OMVPE on GaAs based compliant substrates
|
Vanhollebeke, K. |
|
2000 |
29 |
7 |
p. 933-939 |
artikel |
10 |
Low-dislocation relaxed SiGe grown on an effective compliant substrate
|
Luo, Y. H. |
|
2000 |
29 |
7 |
p. 950-955 |
artikel |
11 |
Optimum antireflection coatings for heteroface AlGaAs/GaAs solar cells—Part II: The influence of uncertainties in the parameters of window and antireflection coatings
|
Rey-Stolle, Ignacio |
|
2000 |
29 |
7 |
p. 992-999 |
artikel |
12 |
Optimum antireflection coatings for heteroface AlGaAs/GaAs solar cells—Part I: The influence of window layer oxidation
|
Rey-Stolle, Ignacio |
|
2000 |
29 |
7 |
p. 984-991 |
artikel |
13 |
Pd/Sb(Zn) and Pd/Ge(Zn) ohmic contacts on p-type indium gallium arsenide: The employment of the solid phase regrowth principle to achieve optimum electrical and metallurgical properties
|
Ressel, P. |
|
2000 |
29 |
7 |
p. 964-972 |
artikel |
14 |
Relaxation enhancing interlayers (REIs) in threading dislocation reduction
|
Romanov, A. E. |
|
2000 |
29 |
7 |
p. 901-905 |
artikel |
15 |
Room temperature wafer bonding of silicon, oxidized silicon, and crystalline quartz
|
Bengtsson, Stefan |
|
2000 |
29 |
7 |
p. 909-915 |
artikel |
16 |
SiGe MOSFET structures on silicon-on-sapphire substrates grown by ultra-high vacuum chemical vapor deposition
|
Mooney, P. M. |
|
2000 |
29 |
7 |
p. 921-927 |
artikel |
17 |
Strain relaxation in InGaAs lattice engineered substrates
|
Chavarkar, P. |
|
2000 |
29 |
7 |
p. 944-949 |
artikel |
18 |
The growth of GaN on lithium gallate (LiGaO2) substrates for material integration
|
Brown, April S. |
|
2000 |
29 |
7 |
p. 894-896 |
artikel |
19 |
Transfer of n-type GaSb onto GaAs substrate by hydrogen implantation and wafer bonding
|
Zheng, Y. |
|
2000 |
29 |
7 |
p. 916-920 |
artikel |
20 |
Transfer of semiconductor and oxide films by wafer bonding and layer cutting
|
Tong, Qin-Yi |
|
2000 |
29 |
7 |
p. 928-933 |
artikel |