| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Adhesion of CVD tin on 316l surgical stainless steel obtained in a mass transfer regime
|
Staia, M. H.
|
|
1997
|
26 |
9 |
p. 980-986
|
artikel
|
| 2 |
Analysis of iodine incorporation in mbe grown CdTe and HgCdTe
|
Parikh, A.
|
|
1997
|
26 |
9 |
p. 1065-1069
|
artikel
|
| 3 |
Characteristics of Si3N4/GaAs metal-lnsulator-semiconductor interfaces with coherent Si/Al0.3Ga0.7As interlayers
|
Park, Dae-Gyu
|
|
1997
|
26 |
9 |
p. 1076-1082
|
artikel
|
| 4 |
Continuous in situ growth rate extraction using pyrometric interferometry and laser reflectance measurement during molecular beam epitaxy
|
Zhou, J.J.
|
|
1997
|
26 |
9 |
p. 1083-1089
|
artikel
|
| 5 |
Crystallographic texture of C54 titanium disilicide as a function of deep submicron structure geometry
|
Svilan, V.
|
|
1997
|
26 |
9 |
p. 1090-1095
|
artikel
|
| 6 |
Elastic modulus measurement of thin film using a dynamic method
|
Kim, Youngman
|
|
1997
|
26 |
9 |
p. 1002-1008
|
artikel
|
| 7 |
Electromigration in aluminum/silicon/copper metallization due to the presence of a thin oxide layer
|
Koh, K.A.
|
|
1997
|
26 |
9 |
p. 1070-1075
|
artikel
|
| 8 |
Evolution of grain structure in thin film reactions
|
Barmak, K.
|
|
1997
|
26 |
9 |
p. 1009-1020
|
artikel
|
| 9 |
Fatigue-creep crack propagation path in solder joints under thermal cycling
|
Liu, D. R.
|
|
1997
|
26 |
9 |
p. 1058-1064
|
artikel
|
| 10 |
Foreword
|
|
|
1997
|
26 |
9 |
p. 959
|
artikel
|
| 11 |
Glancing-angle ion bombardment for modification and monitoring of semiconductor surfaces
|
Labanda, J. G. C.
|
|
1997
|
26 |
9 |
p. 1030-1038
|
artikel
|
| 12 |
Local textures and grain boundaries in voided copper interconnects
|
Keller, R. R.
|
|
1997
|
26 |
9 |
p. 996-1001
|
artikel
|
| 13 |
Mechanisms of strain induced roughening and dislocation multiplication in SixGe1-xthin films
|
Jesson, D. E.
|
|
1997
|
26 |
9 |
p. 1039-1047
|
artikel
|
| 14 |
Molecular view of diamond CVD growth
|
Battaile, C. C.
|
|
1997
|
26 |
9 |
p. 960-965
|
artikel
|
| 15 |
Real-time stress evolution during Si1-xGex Heteroepitaxy: Dislocations, islanding, and segregation
|
Floro, J. A.
|
|
|
26 |
9 |
p. 969-979
|
artikel
|
| 16 |
Real-time stress evolution during Si1-xGex Heteroepitaxy: Dislocations, islanding, and segregation
|
Floro, J. A.
|
|
1997
|
26 |
9 |
p. 969-979
|
artikel
|
| 17 |
Some further microstructural characteristics of face-centered cubic polycrystalline metal thin films
|
Singh, Varun V.
|
|
1997
|
26 |
9 |
p. 987-995
|
artikel
|
| 18 |
Spontaneous lateral composition modulation in AlAs/InAs short period superlattices via the growth front
|
Millunchick, J. Mirecki
|
|
1997
|
26 |
9 |
p. 1048-1052
|
artikel
|
| 19 |
Stress relaxation and thermal evolution of film properties in amorphous carbon
|
Sullivan, J.P
|
|
1997
|
26 |
9 |
p. 1021-1029
|
artikel
|
| 20 |
Structural stability of low temperature grown InGaAs/GaAs heterostructure
|
Park, Chanro
|
|
1997
|
26 |
9 |
p. 1053-1057
|
artikel
|
| 21 |
Surface and interface stress effects on the growth of thin films
|
Cammarata, R. C.
|
|
1997
|
26 |
9 |
p. 966-968
|
artikel
|
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