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                             34 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Adhesive bond durability with conversion coatings Podoba, E.A.
 1981
 9 1-4 p. 359-376
18 p.
 artikel
2 Analysis of aircraft fuel line deposits by polarization infrared fourier micro-emission spectrophotometry Lauer, James L.
 1981
 9 1-4 p. 175-189
15 p.
 artikel
3 Application of AES to failure analysis of commercial nickel and copper alloys Hunt, D.J.
 1981
 9 1-4 p. 141-164
24 p.
 artikel
4 Applications of soft X-rays in the surface analysis of conversion or passivation films Roche, A.
 1981
 9 1-4 p. 227-242
16 p.
 artikel
5 Author index 1981
 9 1-4 p. 400-402
3 p.
 artikel
6 A versatile sample isolation, chemical modification and introduction system designed for a physical electronics model 548 electron spectrometer Miller, C.W.
 1981
 9 1-4 p. 214-226
13 p.
 artikel
7 Citric acid augmented flashlamp cleaning of corroded steel surfaces Brannon, J.H.
 1981
 9 1-4 p. 14-21
8 p.
 artikel
8 Corrosion protection of aluminum by solution-deposited oxide films Stupian, G.W.
 1981
 9 1-4 p. 250-265
16 p.
 artikel
9 Editorial Board 1981
 9 1-4 p. ii-
1 p.
 artikel
10 Effects of implantation and annealing on the Raman spectrum of InP and GaAs Abels, L.L.
 1981
 9 1-4 p. 2-13
12 p.
 artikel
11 Electron beam induced damage in ITO coated Kapton Krainsky, I.
 1981
 9 1-4 p. 39-46
8 p.
 artikel
12 ESCA and SIMS analysis of the composition of passive films formed on E-brite stainless steel Tjong, S.C.
 1981
 9 1-4 p. 92-97
6 p.
 artikel
13 Implications in the use of reactive ion bombardment for secondary ion yield enhancement Wittmaack, Klaus
 1981
 9 1-4 p. 315-334
20 p.
 artikel
14 Improving the accuracy of determination of line energies by ESCA: Chemical state plots for silicon-aluminum compounds Wagner, C.D.
 1981
 9 1-4 p. 203-213
11 p.
 artikel
15 Magnesium diffusion in several aluminum alloys Holub, K.J.
 1981
 9 1-4 p. 22-38
17 p.
 artikel
16 Mass redistribution by atomic mixing in sputter depth profiling Matteson, S.
 1981
 9 1-4 p. 335-344
10 p.
 artikel
17 Measurements of defects and strain in SOS films after cw Ar laser annealing in the liquid phase regime Golecki, I.
 1981
 9 1-4 p. 299-314
16 p.
 artikel
18 Oxidation of ultra-thin lead films on polycrystalline silver surfaces Chadwick, D.
 1981
 9 1-4 p. 98-107
10 p.
 artikel
19 Quantitative interpretation of Auger sputter profiles of thin layers Mitchell, D.F.
 1981
 9 1-4 p. 131-140
10 p.
 artikel
20 Reactive germanium/transition metal interfaces investigated with synchrotron radiation photoemission: Ge/Ni and Ge/Pd Abbati, I.
 1981
 9 1-4 p. 243-249
7 p.
 artikel
21 Residual contamination and corrosion on electrochemically marked uranium Seals, R.D.
 1981
 9 1-4 p. 288-298
11 p.
 artikel
22 Secondary ion mass spectroscopy studies of glass thin films prepared with sol/gel techniques Smith, G.
 1981
 9 1-4 p. 345-358
14 p.
 artikel
23 SIMS analysis of low temperature ohmic contacts to GaAs Katz, W.
 1981
 9 1-4 p. 122-130
9 p.
 artikel
24 Subject index 1981
 9 1-4 p. 403-410
8 p.
 artikel
25 Surface analysis of glasses by fast atom bombardment mass spectrometry Surman, David J.
 1981
 9 1-4 p. 108-121
14 p.
 artikel
26 Surface analysis of Li/SO2 battery electrodes Anderson, C.R.
 1981
 9 1-4 p. 388-399
12 p.
 artikel
27 Surface flattening kinetics by optical scattering technique Hebboul, S.E.
 1981
 9 1-4 p. 74-82
9 p.
 artikel
28 Surface studies of corrosion-preventing coatings for aluminum alloys Matienzo, L.J.
 1981
 9 1-4 p. 47-73
27 p.
 artikel
29 Symposium on applied surface analysis Grant, J.T.
 1981
 9 1-4 p. 1-
1 p.
 artikel
30 Tantalum silicide interconnect characterization by surface analytical techniques Chang, K.Y.
 1981
 9 1-4 p. 377-387
11 p.
 artikel
31 The height sensitive surface roughness parameters Zipin, Richard B.
 1981
 9 1-4 p. 266-287
22 p.
 artikel
32 The structural and electronic properties of cleaved silicon (111) surfaces following adsorption of silver Le Lay, G.
 1981
 9 1-4 p. 190-202
13 p.
 artikel
33 The unified model for Schottky barrier formation and MOS interface states in 3–5 compounds Spicer, W.E.
 1981
 9 1-4 p. 83-91
9 p.
 artikel
34 XPS/ISS investigation of the activation of M-type impregnated dispenser cathodes Lampert, W.V.
 1981
 9 1-4 p. 165-174
10 p.
 artikel
                             34 gevonden resultaten
 
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