nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Ab-initio atom cluster models of carbon surfaces
|
Fink, William H. |
|
1982 |
22-23 |
C |
p. 677-688 12 p. |
artikel |
2 |
Adsorption of formic acid on clean and oxygen covered Pt(111)
|
Avery, Neil R. |
|
1982 |
22-23 |
C |
p. 774-783 10 p. |
artikel |
3 |
A new polarization model of changes in the work function for bare and covered transition metal surfaces
|
Shustorovich, E. |
|
1982 |
22-23 |
C |
p. 693-702 10 p. |
artikel |
4 |
Angular resolved photoemission measurements on clean and hydrogen covered Ge(111) surfaces
|
Bringans, R.D. |
|
1982 |
22-23 |
C |
p. 368-374 7 p. |
artikel |
5 |
Anodization and backscattering measurements of superimposed metal film-GaAs structures
|
Canaday, J.D. |
|
1982 |
22-23 |
C |
p. 209-221 13 p. |
artikel |
6 |
Applications of Rutherford ion backscattering to surface crystallography
|
Unertl, W.N. |
|
1982 |
22-23 |
C |
p. 64-89 26 p. |
artikel |
7 |
A study of nitric oxide adsorption on copper (100) and (110)
|
Wendelken, J.F. |
|
1982 |
22-23 |
C |
p. 172-185 14 p. |
artikel |
8 |
Atomistic or molecular processes on clean surfaces: recent advances
|
Ueda, Ryuzo |
|
1982 |
22-23 |
C |
p. 288-297 10 p. |
artikel |
9 |
Auger line shape analyses for epitaxial growth in the Cu/Cu, Ag/Ag and Ag/Cu systems
|
Vook, R.W. |
|
1982 |
22-23 |
C |
p. 400-407 8 p. |
artikel |
10 |
Author index
|
|
|
1982 |
22-23 |
C |
p. 828-833 6 p. |
artikel |
11 |
Characterization of plasma nitride by AES coupled with nitrogen sputtering
|
Koyama, H. |
|
1982 |
22-23 |
C |
p. 326-331 6 p. |
artikel |
12 |
Copper clusters isolated in oxygen matrices
|
Schmeisser, D. |
|
1982 |
22-23 |
C |
p. 164-171 8 p. |
artikel |
13 |
Coupled electron-LO phonon modes of GaAs-Al x Ga1−x As multilayer systems
|
Das Sarma, S. |
|
1982 |
22-23 |
C |
p. 535-543 9 p. |
artikel |
14 |
Deep energy levels for defects at the AlAs (110) surface
|
Allen, Roland E. |
|
1982 |
22-23 |
C |
p. 362-367 6 p. |
artikel |
15 |
Dependence of the 3p electron energy loss spectra of nickel on momentum transfer
|
Jack, Terrence |
|
1982 |
22-23 |
C |
p. 385-389 5 p. |
artikel |
16 |
Determination and application of the atomic geometries of solid surfaces
|
Duke, C.B. |
|
1982 |
22-23 |
C |
p. 1-19 19 p. |
artikel |
17 |
Determination of anodic oxide film thickness by a luminescence method
|
Zeković, Lj.D. |
|
1982 |
22-23 |
C |
p. 90-99 10 p. |
artikel |
18 |
Determination of surface roughness from X-ray diffraction measurements on thin films
|
Fischer, W. |
|
1982 |
22-23 |
C |
p. 109-117 9 p. |
artikel |
19 |
Direct calculation of experimentally measurable chemisorptive parameters from theoretical quantum chemical cluster models
|
Schwartz, Maurice E. |
|
1982 |
22-23 |
C |
p. 157-163 7 p. |
artikel |
20 |
Direct determination of the island size distribution for parallelogram-shaped islands
|
Zhao, L.-H. |
|
1982 |
22-23 |
C |
p. 634-636 3 p. |
artikel |
21 |
Dopant incorporation studies in silicon molecular beam epitaxy (Si MBE)
|
Allen, F.G. |
|
1982 |
22-23 |
C |
p. 517-527 11 p. |
artikel |
22 |
Dynamic simulation of changes in near-surface composition during ion bombardment
|
Roush, M.L. |
|
1982 |
22-23 |
C |
p. 235-242 8 p. |
artikel |
23 |
Editorial Board
|
|
|
1982 |
22-23 |
C |
p. CO2- 1 p. |
artikel |
24 |
Electrical effects of hydrogen on SnTe thin films
|
Dawar, A.L. |
|
1982 |
22-23 |
C |
p. 598-604 7 p. |
artikel |
25 |
Electrical effects of thallium, sodium and silver impurities on lead telluride thin films
|
Dawar, A.L. |
|
1982 |
22-23 |
C |
p. 583-597 15 p. |
artikel |
26 |
Electrical properties of sputtered RuO2 films
|
Takeuchi, M. |
|
1982 |
22-23 |
C |
p. 298-307 10 p. |
artikel |
27 |
Electronic structure of evaporated and annealed tungsten oxide films studied with UPS
|
Höchst, H. |
|
1982 |
22-23 |
C |
p. 768-773 6 p. |
artikel |
28 |
Electronic surface states of II–VI compound semiconductors
|
Takahashi, Tadashi |
|
1982 |
22-23 |
C |
p. 268-287 20 p. |
artikel |
29 |
Epitaxy of metals on metals
|
Bauer, E. |
|
1982 |
22-23 |
C |
p. 479-494 16 p. |
artikel |
30 |
ESCA signal intensity dependence on surface area (roughness)
|
Wu, O.K.T. |
|
1982 |
22-23 |
C |
p. 118-130 13 p. |
artikel |
31 |
Extended absorption fine structure analysis of surface structure
|
Einstein, Theodore L. |
|
1982 |
22-23 |
C |
p. 42-63 22 p. |
artikel |
32 |
Field effect studies on metal-insulator-semiconductor structures of PbTe films
|
Dawar, A.L. |
|
1982 |
22-23 |
C |
p. 574-582 9 p. |
artikel |
33 |
Growth and structure of electron-beam evaporated ZnS films
|
Chin, T.N. |
|
1982 |
22-23 |
C |
p. 553-562 10 p. |
artikel |
34 |
Hartree-Fock theory of multilayer physisorption
|
Kreuzer, H.J. |
|
1982 |
22-23 |
C |
p. 812-818 7 p. |
artikel |
35 |
H2O interaction with Ni(110): Auto-catalytic decomposition in the temperature range from 400 to 550 K
|
Benndorf, C. |
|
1982 |
22-23 |
C |
p. 803-811 9 p. |
artikel |
36 |
Influence of the surface reconstruction on the work function and surface conductance of (110)SnO2
|
De Frésart, E. |
|
1982 |
22-23 |
C |
p. 637-651 15 p. |
artikel |
37 |
Interaction electron-matière: Application à la mesure de l'épaisseur d'une lame mince solide
|
Landron, Claude |
|
1982 |
22-23 |
C |
p. 100-108 9 p. |
artikel |
38 |
Interaction of metals with semiconductor surfaces
|
Brillson, L.J. |
|
1982 |
22-23 |
C |
p. 249-267 19 p. |
artikel |
39 |
Interionic interaction at metallic surfaces
|
Barnett, R.N. |
|
1982 |
22-23 |
C |
p. 703-711 9 p. |
artikel |
40 |
Intermixing at the early stage of the Si(111)/Ag interface growth
|
Rossi, G. |
|
1982 |
22-23 |
C |
p. 348-354 7 p. |
artikel |
41 |
Ion formation from solid surfaces due to very rapid energy transfer
|
Krueger, Franz R. |
|
1982 |
22-23 |
C |
p. 819-827 9 p. |
artikel |
42 |
Kinetic equations for physisorption; With some remarks on the compensation effect
|
Kreuzer, H.J. |
|
1982 |
22-23 |
C |
p. 793-802 10 p. |
artikel |
43 |
LEED and surface structure
|
Marcus, P.M. |
|
1982 |
22-23 |
C |
p. 20-41 22 p. |
artikel |
44 |
LEED studies of surface imperfections
|
Henzler, M. |
|
1982 |
22-23 |
C |
p. 450-469 20 p. |
artikel |
45 |
Low loss surface imaging and transmission microscopy of growth of some thin films
|
Smith, D.A. |
|
1982 |
22-23 |
C |
p. 131-143 13 p. |
artikel |
46 |
Luminescence analysis of an impurity in the near-surface layer of thermally evaporated silicon
|
Aleksandrov, L.N. |
|
1982 |
22-23 |
C |
p. 375-384 10 p. |
artikel |
47 |
Magnetic moments at the surface of 3D transition metals
|
Dorantes-Davila, J. |
|
1982 |
22-23 |
C |
p. 689-692 4 p. |
artikel |
48 |
Misfit accommodation at interfaces by dislocations
|
Woltersdorf, J. |
|
1982 |
22-23 |
C |
p. 495-516 22 p. |
artikel |
49 |
Molybdenum nitride film growth by reaction with N+ 2 and N+ beams: Energy and dose dependence
|
Baldwin, David A. |
|
1982 |
22-23 |
C |
p. 229-234 6 p. |
artikel |
50 |
Multilayer film structures for light sources
|
Aleksandrov, L.N. |
|
1982 |
22-23 |
C |
p. 563-573 11 p. |
artikel |
51 |
Observation of the structural transition Pt(100) 1 × 1 → hex by LEED intensities
|
Heinz, K. |
|
1982 |
22-23 |
C |
p. 611-624 14 p. |
artikel |
52 |
On the chemisorption of Ge on GaAs(110) surfaces: UPS and work function measurements
|
Gant, H. |
|
1982 |
22-23 |
C |
p. 332-347 16 p. |
artikel |
53 |
Optical and electrical properties of hydrogenated amorphous silicon films deposited by tetrode RF sputtering
|
Gekka, Yasuo |
|
1982 |
22-23 |
C |
p. 528-534 7 p. |
artikel |
54 |
Order in two dimensions
|
Roelofs, Lyle D. |
|
1982 |
22-23 |
C |
p. 425-449 25 p. |
artikel |
55 |
Preface
|
William Gadzuk, J. |
|
1982 |
22-23 |
C |
p. ix- 1 p. |
artikel |
56 |
Production and properties of sputtered thin films for solar selective absorbing surfaces
|
Harding, G.L. |
|
1982 |
22-23 |
C |
p. 315-325 11 p. |
artikel |
57 |
Pulsed laser atom-probe study of clean and oxygen-covered silicon
|
Kellogg, G.L. |
|
1982 |
22-23 |
C |
p. 186-195 10 p. |
artikel |
58 |
Reflection high energy diffraction by the Ag(001), Ag(110) and Ag(111) surfaces
|
Maksym, P.A. |
|
1982 |
22-23 |
C |
p. 663-676 14 p. |
artikel |
59 |
Soft X-ray appearance-potential spectra of Ho and Ho/Ni alloy
|
Chopra, D.R. |
|
1982 |
22-23 |
C |
p. 390-399 10 p. |
artikel |
60 |
Some aspects and results of quantitative electron loss spectroscopy
|
Margoninski, Y. |
|
1982 |
22-23 |
C |
p. 784-792 9 p. |
artikel |
61 |
Stainless-steel oxidation investigation using nuclear techniques for surface studies with an automated scanning proton microbeam: Experimental system and results
|
Calvert, J.M. |
|
1982 |
22-23 |
C |
p. 243-248 6 p. |
artikel |
62 |
Structure and shape of epitaxial metal clusters
|
Schabes-Retchkiman, P.S. |
|
1982 |
22-23 |
C |
p. 149-156 8 p. |
artikel |
63 |
Structures of Cs adlayers on reconstructed Ir, Pt and Au surfaces
|
Müller, K. |
|
1982 |
22-23 |
C |
p. 625-633 9 p. |
artikel |
64 |
Studies of thin films of Li-B alloys
|
Kezuka, Hiroshi |
|
1982 |
22-23 |
C |
p. 144-148 5 p. |
artikel |
65 |
Subject index
|
|
|
1982 |
22-23 |
C |
p. 834-847 14 p. |
artikel |
66 |
Substrate biased RF sputtering of zinc oxide films
|
Murti, D.K. |
|
1982 |
22-23 |
C |
p. 308-314 7 p. |
artikel |
67 |
Surface chemical characterization by Auger signal decomposition: Silicon nitride
|
Madden, H.H. |
|
1982 |
22-23 |
C |
p. 408-419 12 p. |
artikel |
68 |
Surface pre-treatment dependent formation of molybdenum nitride by low energy N+ 2 ion bombardment
|
Shamir, Noah |
|
1982 |
22-23 |
C |
p. 222-228 7 p. |
artikel |
69 |
Surface reconstruction of clean (001)W
|
Melmed, A.J. |
|
1982 |
22-23 |
C |
p. 470-478 9 p. |
artikel |
70 |
Surface studies of InP by electron energy loss spectroscopy and Auger electron spectroscopy
|
Tu, C.W. |
|
1982 |
22-23 |
C |
p. 355-361 7 p. |
artikel |
71 |
Temperature dependence in UV photoemission from Cu(111)
|
Mårtensson, H. |
|
1982 |
22-23 |
C |
p. 652-662 11 p. |
artikel |
72 |
Theory of the DC conductivity for a two-dimensional superionic conductor on the honeycomb lattice
|
Tanaka, T. |
|
1982 |
22-23 |
C |
p. 605-610 6 p. |
artikel |
73 |
The sputtering of molecular ions from surfaces in secondary ion mass spectrometry
|
Yu, Ming L. |
|
1982 |
22-23 |
C |
p. 196-201 6 p. |
artikel |
74 |
The substrate heating effects on ion-beam sputter-deposited CuInS2 and GaP thin films
|
Chen, Jiann-Ruey |
|
1982 |
22-23 |
C |
p. 544-552 9 p. |
artikel |
75 |
Thin Ag films on Al(100)
|
Egelhoff Jr., W.F. |
|
1982 |
22-23 |
C |
p. 761-767 7 p. |
artikel |
76 |
Transmission electron microscope study of ion beam induced interfacial reactions in molybdenum thin films on silicon
|
Chen, L.J. |
|
1982 |
22-23 |
C |
p. 202-208 7 p. |
artikel |
77 |
Vibrational spectroscopy of adsorbed atoms and molecules
|
Bradshaw, A.M. |
|
1982 |
22-23 |
C |
p. 712-729 18 p. |
artikel |
78 |
XPS studies of the photodecomposition of AgCl
|
Sharma, J. |
|
1982 |
22-23 |
C |
p. 420-424 5 p. |
artikel |
79 |
X-ray excited Auger studies of metals and alloys
|
Kleiman, George G. |
|
1982 |
22-23 |
C |
p. 730-760 31 p. |
artikel |