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                             28 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 An XPS comparative study on thermal oxide barrier formation on Nb and NbN thin films Ermolieff, A.
1985
21 1-4 p. 65-79
15 p.
artikel
2 Applications of the tunneling model to the prediction of low damage SIMS yields for submonolayer adatom coverages Lamartine, B.C.
1985
21 1-4 p. 210-218
9 p.
artikel
3 Auger electron spectroscopy observations of the V 2 O 5−V 6 O 13 phase transition Tompkins, H.G.
1985
21 1-4 p. 280-287
8 p.
artikel
4 Author index 1985
21 1-4 p. 314-316
3 p.
artikel
5 Bonding information from Auger spectroscopy Ramaker, David E.
1985
21 1-4 p. 243-267
25 p.
artikel
6 Chemical constituents of eroded gun surfaces Lin, Sin-Shong
1985
21 1-4 p. 112-124
13 p.
artikel
7 Corrosion resistant behavior of amorphous Mo−Ni> films formed by ion beam mixing Rai, A.K.
1985
21 1-4 p. 95-111
17 p.
artikel
8 Desorption of organics from silver zeolite Jolley, J.G.
1985
21 1-4 p. 288-296
9 p.
artikel
9 Editorial Board 1985
21 1-4 p. iv-
1 p.
artikel
10 Effects of boron impurity on the surface reactions of C2N2 on Rh(111) and Rh foil Solymosi, Frigyes
1985
21 1-4 p. 125-138
14 p.
artikel
11 Foreword Grant, J.T.
1985
21 1-4 p. vii-
1 p.
artikel
12 HREELS and Auger studies of conducting polymers Jennings, W.D.
1985
21 1-4 p. 80-94
15 p.
artikel
13 Local structure investigations of carbon by surface extended energy loss fine structure Natarajan, C.
1985
21 1-4 p. 1-11
11 p.
artikel
14 Measurement of hydroxyl ions in thin passive oxide films using secondary ion mass spectrometry Mitchell, D.F.
1985
21 1-4 p. 199-209
11 p.
artikel
15 Measurement of work function in a cylindrical mirror electron spectrometer and application to characterization of thermionic electron emitters Eyink, K.G.
1985
21 1-4 p. 29-36
8 p.
artikel
16 Molecular secondary ion mass spectrometry: New dimensions in chemical characterization Colton, Richard J.
1985
21 1-4 p. 168-198
31 p.
artikel
17 Oxidation studies of CoCr thin films for use as magnetic media Swami, G.T.K.
1985
21 1-4 p. 151-159
9 p.
artikel
18 Photoanodic behaviour of thin CdS films: Surface chemical modifications analyzed by XRFS, LEEIXS, and XPS Roche, A.
1985
21 1-4 p. 12-28
17 p.
artikel
19 SEM and ESCA study of fractured borosilicate glass to Kovar seals Macey, Christopher J.
1985
21 1-4 p. 139-150
12 p.
artikel
20 Software for surface analysis Watson, D.G.
1985
21 1-4 p. 304-313
10 p.
artikel
21 Study of hydroxyl formation on Pt(111) surface by EELS and low temperature reaction quenching Melo, A.V.
1985
21 1-4 p. 160-167
8 p.
artikel
22 Subject index 1985
21 1-4 p. 317-322
6 p.
artikel
23 Surface analysis of adsorbed species from epoxy adhesives used in microelectronics Benson, R.C.
1985
21 1-4 p. 219-229
11 p.
artikel
24 Surface analysis of dealuminated Y zeolites by ESCA Shyu, J.Z.
1985
21 1-4 p. 297-303
7 p.
artikel
25 Surface coverage, work function and poisoning characteristics of a half rhenium coated impregnated scandate cathode Maloney, C.E.
1985
21 1-4 p. 50-64
15 p.
artikel
26 The characterization of surface carbon on organic bearing shale by Auger lineshape analysis King, James A.
1985
21 1-4 p. 268-279
12 p.
artikel
27 Titanium impurity effects in thin film oxide cathodes Schmid, R.S.
1985
21 1-4 p. 37-49
13 p.
artikel
28 Transient effects in SIMS analysis for different angles of incidence of an O+ 2 primary ion beam Vandervorst, W.
1985
21 1-4 p. 230-242
13 p.
artikel
                             28 gevonden resultaten
 
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