nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Analysis of the infrared plasma reflectivity spectra of semiconductors
|
Gopal, Vishnu |
|
1978 |
18 |
2 |
p. 121-125 5 p. |
artikel |
2 |
An equivalent circuit model for microwave-biased extrinsic photoconductors∗
|
Crouch Jr, J.N. |
|
1978 |
18 |
2 |
p. 89-98 10 p. |
artikel |
3 |
A new version of a Michelson interferometer for Fourier transform infrared spectroscopy∗
|
Genzel, L. |
|
1978 |
18 |
2 |
p. 113-120 8 p. |
artikel |
4 |
Counterdoped extrinsic silicon infrared detectors
|
Elliott, C.T. |
|
1978 |
18 |
2 |
p. 65-71 7 p. |
artikel |
5 |
Increasing the dynamic range of semiconductor laser detectors
|
Malyutenko, V.K. |
|
1978 |
18 |
2 |
p. 107-111 5 p. |
artikel |
6 |
Magnetospectroscopy of CaF2:Dy2+ in the submillimeter∗
|
Waldman, J. |
|
1978 |
18 |
2 |
p. 141-146 6 p. |
artikel |
7 |
Millimetric and far infrared conductivity of p-Si. Evidence for interband transitions
|
Vindevoghel, J. |
|
1978 |
18 |
2 |
p. 99-105 7 p. |
artikel |
8 |
Modulation de la transmission infrarouge d'un gaz soumis à un champ électrique. Application au cas de l'ammoniac à 2,2 μm
|
Courtois, D. |
|
1978 |
18 |
2 |
p. 147-153 7 p. |
artikel |
9 |
Single mesh narrow bandpass filters from the infrared to the submillimeter region
|
Sakai, K. |
|
1978 |
18 |
2 |
p. 137-140 4 p. |
artikel |
10 |
The interpretation of X-ray diffraction data from thin epitaxial lead tin telluride crystals—II
|
Bicknell, R.W. |
|
1978 |
18 |
2 |
p. 133-136 4 p. |
artikel |
11 |
The refractive index of isotropic and orientated polyethyleneterephtalate in the 40–300 cm−1 range
|
Schleussner, G. |
|
1978 |
18 |
2 |
p. 155-156 2 p. |
artikel |
12 |
Thermal properties of reticulated layers: Analytical solutions and design parameters
|
Watton, R. |
|
1978 |
18 |
2 |
p. 73-87 15 p. |
artikel |
13 |
The water vapour content in the western European atmosphere obtained from infrared measurements
|
Greve, A. |
|
1978 |
18 |
2 |
p. 127-132 6 p. |
artikel |