| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A wide field infrared photometer
|
Baddiley, C.J.
|
|
1977
|
17 |
5 |
p. 405-413
9 p.
|
artikel
|
| 2 |
Computer control of a far infrared interferometer
|
Breecher, J.
|
|
1977
|
17 |
5 |
p. 423-424
2 p.
|
artikel
|
| 3 |
Concept of an effective optical distortion parameter: Application to KCl laser windows
|
Klein, Claude A.
|
|
1977
|
17 |
5 |
p. 343-357
15 p.
|
artikel
|
| 4 |
Errors in minimum resolvable temperature difference charts
|
Wolfe, William L.
|
|
1977
|
17 |
5 |
p. 375-379
5 p.
|
artikel
|
| 5 |
Image-scanning systems using tilting plane mirrors
|
Baddiley, C.J.
|
|
1977
|
17 |
5 |
p. 393-404
12 p.
|
artikel
|
| 6 |
New modular interferometer for fourier transform spectroscopy at high resolution in far infrared
|
Bachet, Gérard
|
|
1977
|
17 |
5 |
p. 359-364
6 p.
|
artikel
|
| 7 |
Optical constants of various heavily doped p- and n-type silicon crystals obtained by Kramers-Kronig analysis
|
Barta, Elizabeth
|
|
1977
|
17 |
5 |
p. 319-329
11 p.
|
artikel
|
| 8 |
Sailcloth, a low loss material for millimetre and submillimetre wavelengths
|
Birch, J.R.
|
|
1977
|
17 |
5 |
p. 425-426
2 p.
|
artikel
|
| 9 |
The correlation infrared process analyzer
|
Garfunkel, J.H.
|
|
1977
|
17 |
5 |
p. 331-342
12 p.
|
artikel
|
| 10 |
The determination of complex refractive indices with fourier transform interferometry—VI
|
Passchier, W.F.
|
|
1977
|
17 |
5 |
p. 381-391
11 p.
|
artikel
|
| 11 |
Thermal imaging system performance estimates
|
Emmons, R.B.
|
|
1977
|
17 |
5 |
p. 415-418
4 p.
|
artikel
|
| 12 |
The spectral response of Pb/SnTe detectors
|
Ellis, Brian
|
|
1977
|
17 |
5 |
p. 365-374
10 p.
|
artikel
|
| 13 |
Two-color sandwich detector using InSb/Pb0.79Sn0.21Te
|
Rolls, William
|
|
1977
|
17 |
5 |
p. 419-421
3 p.
|
artikel
|
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