| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Dossier Sommaire
|
|
|
2014
|
15 |
2-3 |
p. iii-iv
nvt p.
|
artikel
|
| 2 |
Editorial Board
|
|
|
2014
|
15 |
2-3 |
p. IFC-
1 p.
|
artikel
|
| 3 |
Editorial Board
|
|
|
2014
|
15 |
2-3 |
p. IBC-
1 p.
|
artikel
|
| 4 |
Elemental analysis down to the single atom with electron beams
|
Suenaga, Kazu
|
|
2014
|
15 |
2-3 |
p. 151-157
7 p.
|
artikel
|
| 5 |
Future directions in high-resolution electron microscopy: Novel optical components and techniques
|
Hawkes, Peter
|
|
2014
|
15 |
2-3 |
p. 110-118
9 p.
|
artikel
|
| 6 |
In situ mechanical TEM: Seeing and measuring under stress with electrons
|
Legros, Marc
|
|
2014
|
15 |
2-3 |
p. 224-240
17 p.
|
artikel
|
| 7 |
Interferometric methods for mapping static electric and magnetic fields
|
Pozzi, Giulio
|
|
2014
|
15 |
2-3 |
p. 126-139
14 p.
|
artikel
|
| 8 |
Liquid scanning transmission electron microscopy: Nanoscale imaging in micrometers-thick liquids
|
Schuh, Tobias
|
|
2014
|
15 |
2-3 |
p. 214-223
10 p.
|
artikel
|
| 9 |
Measuring three-dimensional positions of atoms to the highest accuracy with electrons
|
Koch, Christoph T.
|
|
2014
|
15 |
2-3 |
p. 119-125
7 p.
|
artikel
|
| 10 |
Networking strategies of the microscopy community for improved utilisation of advanced instruments: (1) The Australian Microscopy and Microanalysis Research Facility (AMMRF)
|
Ringer, Simon P.
|
|
2014
|
15 |
2-3 |
p. 269-275
7 p.
|
artikel
|
| 11 |
Networking strategies of the microscopy community for improved utilisation of advanced instruments: (3) Two European initiatives to support TEM infrastructures and promote electron microscopy over Europe, ESTEEM (2006–2011) and ESTEEM 2 (2012–2016)
|
Snoeck, Etienne
|
|
2014
|
15 |
2-3 |
p. 281-284
4 p.
|
artikel
|
| 12 |
Networking strategies of the microscopy community for improved utilization of advanced instruments: (2) The national network for transmission electron microscopy and atom probe studies in France (METSA)
|
Épicier, Thierry
|
|
2014
|
15 |
2-3 |
p. 276-280
5 p.
|
artikel
|
| 13 |
Seeing and measuring in colours: Electron microscopy and spectroscopies applied to nano-optics
|
Kociak, Mathieu
|
|
2014
|
15 |
2-3 |
p. 158-175
18 p.
|
artikel
|
| 14 |
Seeing and measuring in 3D with electrons
|
Bals, Sara
|
|
2014
|
15 |
2-3 |
p. 140-150
11 p.
|
artikel
|
| 15 |
Seeing and measuring with electrons: Transmission electron microscopy today and tomorrow – An introduction
|
Colliex, Christian
|
|
2014
|
15 |
2-3 |
p. 101-109
9 p.
|
artikel
|
| 16 |
Seeing in 4D with electrons: Development of ultrafast electron microscopy at Caltech
|
Spencer Baskin, J.
|
|
2014
|
15 |
2-3 |
p. 176-189
14 p.
|
artikel
|
| 17 |
Shaping electron beams for the generation of innovative measurements in the (S)TEM
|
Verbeeck, Jo
|
|
2014
|
15 |
2-3 |
p. 190-199
10 p.
|
artikel
|
| 18 |
Une transition liquide–gaz pour des bosons en interaction attractive à une dimension
|
Herzog, Christopher
|
|
2014
|
15 |
2-3 |
p. 285-296
12 p.
|
artikel
|
| 19 |
Using electron beams to investigate carbonaceous materials
|
Mangler, Clemens
|
|
2014
|
15 |
2-3 |
p. 241-257
17 p.
|
artikel
|
| 20 |
Using electron beams to investigate catalytic materials
|
Zhang, Bingsen
|
|
2014
|
15 |
2-3 |
p. 258-268
11 p.
|
artikel
|
| 21 |
Visualising reacting single atoms under controlled conditions: Advances in atomic resolution in situ Environmental (Scanning) Transmission Electron Microscopy (E(S)TEM)
|
Boyes, Edward D.
|
|
2014
|
15 |
2-3 |
p. 200-213
14 p.
|
artikel
|
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