| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Cu(111)(√3×√3)R30°-Sb structure by impact collision ion-scattering spectroscopy
|
Umezawa, K.
|
|
2003
|
3 |
1 |
p. 71-74
4 p.
|
artikel
|
| 2 |
Aspects of layer-by-layer composition analysis using MEIS
|
Bailey, P.
|
|
2003
|
3 |
1 |
p. 89-92
4 p.
|
artikel
|
| 3 |
Atomic structure of Cs grown on Si(001)(2×1) surface by coaxial impact collision ion scattering spectroscopy
|
Kim, J.Y.
|
|
2003
|
3 |
1 |
p. 83-88
6 p.
|
artikel
|
| 4 |
Charge exchange for medium energy He and Ne ions in a large-angle collision at solid surfaces
|
Kido, Yoshiaki
|
|
2003
|
3 |
1 |
p. 3-7
5 p.
|
artikel
|
| 5 |
Depth profiling of ultrathin films using medium energy ion scattering
|
Kim, Joonkon
|
|
2003
|
3 |
1 |
p. 75-82
8 p.
|
artikel
|
| 6 |
Depth resolution and narrow nuclear resonance profiling
|
Vickridge, I.C.
|
|
2003
|
3 |
1 |
p. 51-55
5 p.
|
artikel
|
| 7 |
Editorial board
|
|
|
2003
|
3 |
1 |
p. IFC-
1 p.
|
artikel
|
| 8 |
Exploring surface processes by coaxial impact-collision ion scattering spectroscopy and time-of-flight elastic recoil detection analysis
|
Katayama, Mitsuhiro
|
|
2003
|
3 |
1 |
p. 65-69
5 p.
|
artikel
|
| 9 |
Femtosecond electron dynamics on solid surfaces probed by low energy ion scattering and stimulated desorption of secondary ions
|
Souda, Ryutaro
|
|
2003
|
3 |
1 |
p. 13-17
5 p.
|
artikel
|
| 10 |
High-resolution depth profiling of ultrashallow boron implants in silicon using high-resolution RBS
|
Kimura, Kenji
|
|
2003
|
3 |
1 |
p. 9-11
3 p.
|
artikel
|
| 11 |
Interface strain profiling in ultrathin SiO2 gate oxides with medium energy ion scattering spectroscopy
|
Moon, D.W.
|
|
2003
|
3 |
1 |
p. 45-49
5 p.
|
artikel
|
| 12 |
Ion beam as a probe to study the behavior of hydrogen on silicon surfaces
|
Oura, Kenjiro
|
|
2003
|
3 |
1 |
p. 39-44
6 p.
|
artikel
|
| 13 |
Ion-induced emission microscopies
|
Doyle, B.L.
|
|
2003
|
3 |
1 |
p. 31-34
4 p.
|
artikel
|
| 14 |
[No title]
|
Moon, DaeWon
|
|
2003
|
3 |
1 |
p. 1-
1 p.
|
artikel
|
| 15 |
Reactive ion scattering study of physisorbed adsorbates: experiment and theory
|
Lahaye, R.J.W.E.
|
|
2003
|
3 |
1 |
p. 25-29
5 p.
|
artikel
|
| 16 |
Sputter damage in Si surface by low energy Ar+ ion bombardment
|
Shin, Hye Chung
|
|
2003
|
3 |
1 |
p. 61-64
4 p.
|
artikel
|
| 17 |
Structural studies at metallic surfaces and interfaces using MEIS
|
Woodruff, D.P.
|
|
2003
|
3 |
1 |
p. 19-24
6 p.
|
artikel
|
| 18 |
Structure analysis of the Si(111)- 3 × 3 -Sb surface by means of CAICISS combined with LEED–AES–RBS techniques
|
Kishi, N.
|
|
2003
|
3 |
1 |
p. 57-60
4 p.
|
artikel
|
| 19 |
The role of basic energy-loss processes in layer-resolved surface investigations with ions
|
Schiwietz, G.
|
|
2003
|
3 |
1 |
p. 35-37
3 p.
|
artikel
|
Tijdschrift beschrijving