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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
6 results found
| no | title | author | magazine | year | volume | issue | page(s) | type |
| 1 | A fault tolerant multistage interconnection network with partly duplicated switches |
Kamiura, Naotake |
2002 |
47 | 10 |
p. 901-916 16 p. |
article |
|
| 2 | A new approach for critical area estimation in VLSI |
Jiang, Xiaohong |
2002 |
47 | 10 |
p. 869-881 13 p. |
article |
|
| 3 | A prototype of a VHDL-based fault injection tool: description and application |
Baraza, J.C |
2002 |
47 | 10 |
p. 847-867 21 p. |
article |
|
| 4 | Behavioral test generation for the selection of BIST logic |
Biasoli, Giuseppe |
2002 |
47 | 10 |
p. 821-829 9 p. |
article |
|
| 5 | Quality-effective repair of multichip module systems |
Park, N. |
2002 |
47 | 10 |
p. 883-900 18 p. |
article |
|
| 6 | Studies of the SEMATECH IDDq test data |
Ko, Seok-Bum |
2002 |
47 | 10 |
p. 831-846 16 p. |
article |
6 results found