| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
Blue lasers continue to set the pace in optoelectronics
|
Szweda, Roy
|
|
1997
|
10 |
5 |
p. 20-25
6 p.
|
article
|
| 2 |
Confocal semiconductor inspection from Nikon
|
|
|
1997
|
10 |
5 |
p. 50-
1 p.
|
article
|
| 3 |
Cryostats for electrical and magnetic characterization
|
|
|
1997
|
10 |
5 |
p. 49-
1 p.
|
article
|
| 4 |
Developments in vertical Bridgman growth of large diameter GaAs
|
Sonnenberg, K.
|
|
1997
|
10 |
5 |
p. 30-34
5 p.
|
article
|
| 5 |
Diary of 1997/1998 events
|
|
|
1997
|
10 |
5 |
p. 52-53
2 p.
|
article
|
| 6 |
Electrometer for high resistance measurements
|
|
|
1997
|
10 |
5 |
p. 54-
1 p.
|
article
|
| 7 |
ESPRIT SEED aims to achieve more reliable electronic parts
|
Szweda, Roy
|
|
1997
|
10 |
5 |
p. 43-44
2 p.
|
article
|
| 8 |
French Riviera hosts Second European GaN Workshop
|
Strite, Toby
|
|
1997
|
10 |
5 |
p. 47-48
2 p.
|
article
|
| 9 |
Improved gas analysis systems from VG
|
|
|
1997
|
10 |
5 |
p. 50-
1 p.
|
article
|
| 10 |
Improved wafers for blue light-emitting devices
|
|
|
1997
|
10 |
5 |
p. 4-
1 p.
|
article
|
| 11 |
Infrared macroscope from semimetrics
|
|
|
1997
|
10 |
5 |
p. 49-
1 p.
|
article
|
| 12 |
InPact — the indium phosphide specialists
|
Marsan, Didier
|
|
1997
|
10 |
5 |
p. 16-18
3 p.
|
article
|
| 13 |
Karl Zeiss images in 3D
|
|
|
1997
|
10 |
5 |
p. 51-
1 p.
|
article
|
| 14 |
LDSD 97 success in Portugal
|
Henini, Mohamed
|
|
1997
|
10 |
5 |
p. 45-46
2 p.
|
article
|
| 15 |
Leak detector doubles throughout
|
|
|
1997
|
10 |
5 |
p. 54-
1 p.
|
article
|
| 16 |
Magnetic coupling maximizes uptime for vacuum pump
|
|
|
1997
|
10 |
5 |
p. 54-
1 p.
|
article
|
| 17 |
MCMs: enabling GaAs?
|
Szweda, Roy
|
|
1997
|
10 |
5 |
p. 55-
1 p.
|
article
|
| 18 |
Partnership for chemical and crystallographic characterization
|
|
|
1997
|
10 |
5 |
p. 50-
1 p.
|
article
|
| 19 |
Real-time process control with in situ spectroscopic ellipsometry
|
Johs, Blaine
|
|
1997
|
10 |
5 |
p. 40-42
3 p.
|
article
|
| 20 |
RGA for corrosive semiconductor applications
|
|
|
1997
|
10 |
5 |
p. 51-
1 p.
|
article
|
| 21 |
Round-robin test for flatness measurement of GaAs wafers
|
|
|
1997
|
10 |
5 |
p. 35-39
5 p.
|
article
|
| 22 |
Surface analysis
|
|
|
1997
|
10 |
5 |
p. 51-
1 p.
|
article
|
| 23 |
The race is on
|
Finch, David
|
|
1997
|
10 |
5 |
p. 2-
1 p.
|
article
|
| 24 |
What's all this talk about ‘MEMS’?
|
McDonald, Jo Ann
|
|
1997
|
10 |
5 |
p. 26-29
4 p.
|
article
|
Journal description