nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
AEA's green scrubbers help semiconductor industry
|
|
|
1997 |
10 |
4 |
p. 8- 1 p. |
artikel |
2 |
Ametek offer low level gas moisture analysis
|
|
|
1997 |
10 |
4 |
p. 49- 1 p. |
artikel |
3 |
Applied thermal control launch world's smallest chiller
|
|
|
1997 |
10 |
4 |
p. 50- 1 p. |
artikel |
4 |
Compound semiconductors at the Spring MRS
|
Mills, Alan |
|
1997 |
10 |
4 |
p. 43-45 3 p. |
artikel |
5 |
Dialight to supply blue LEDs
|
|
|
1997 |
10 |
4 |
p. 6- 1 p. |
artikel |
6 |
Diary of 1997/8 events
|
|
|
1997 |
10 |
4 |
p. 52-53 2 p. |
artikel |
7 |
3D+ makes MCM-V micro-camera for BT
|
|
|
1997 |
10 |
4 |
p. 6- 1 p. |
artikel |
8 |
Electronic displays market to reach $46.5 billion by 2001
|
|
|
1997 |
10 |
4 |
p. 6- 1 p. |
artikel |
9 |
Fast fax reply service
|
|
|
1997 |
10 |
4 |
p. 56- 1 p. |
artikel |
10 |
Handbook of microlitography, micromachining & microfabrication, vol. 1: Microlitography
|
Szweda, Roy |
|
1997 |
10 |
4 |
p. 54- 1 p. |
artikel |
11 |
Improved efficiency coolers suitable for high power opto components
|
|
|
1997 |
10 |
4 |
p. 10- 1 p. |
artikel |
12 |
LED applications abound at Traffex 1997
|
|
|
1997 |
10 |
4 |
p. 12- 1 p. |
artikel |
13 |
MKS flow verifier increases tool uptime
|
|
|
1997 |
10 |
4 |
p. 49- 1 p. |
artikel |
14 |
MMICs and MIMIC: a perspective on American GaAs
|
McDonald, Jo Ann |
|
1997 |
10 |
4 |
p. 18-22 5 p. |
artikel |
15 |
Morton to expand metalorganics production in Massachusetts
|
|
|
1997 |
10 |
4 |
p. 4- 1 p. |
artikel |
16 |
MOVPE for production scale manufacturing
|
O'Connell, S. |
|
1997 |
10 |
4 |
p. 14-17 4 p. |
artikel |
17 |
New capabilities for inspection microscope
|
|
|
1997 |
10 |
4 |
p. 49- 1 p. |
artikel |
18 |
New system offers fully automated thin film measurement
|
|
|
1997 |
10 |
4 |
p. 50- 1 p. |
artikel |
19 |
Northern telecom buys tegal etch system
|
|
|
1997 |
10 |
4 |
p. 4- 1 p. |
artikel |
20 |
OMVPE-VIII workshop — the successes of real time process monitoring
|
Mills, Alan |
|
1997 |
10 |
4 |
p. 46-48 3 p. |
artikel |
21 |
Ordering in GaInP: epitaxy, basic characteristics and device relevance
|
Scholz, F. |
|
1997 |
10 |
4 |
p. 38-42 5 p. |
artikel |
22 |
Patents and the growth of the nitride markets
|
Szweda, Roy |
|
1997 |
10 |
4 |
p. 55- 1 p. |
artikel |
23 |
Picogiga builds fab in less than four months
|
|
|
1997 |
10 |
4 |
p. 10- 1 p. |
artikel |
24 |
Properties of GaAs
|
Szweda, Roy |
|
1997 |
10 |
4 |
p. 54- 1 p. |
artikel |
25 |
Properties of group III nitrides
|
Szweda, Roy |
|
1997 |
10 |
4 |
p. 54- 1 p. |
artikel |
26 |
Properties of wide bandgap II-VI semiconductors
|
Szweda, Roy |
|
1997 |
10 |
4 |
p. 54- 1 p. |
artikel |
27 |
Radar sensors bought down to size
|
|
|
1997 |
10 |
4 |
p. 8- 1 p. |
artikel |
28 |
Round-robin test for flatness measurement of GaAs wafers
|
|
|
1997 |
10 |
4 |
p. 24-26 3 p. |
artikel |
29 |
R-P suspends GA extraction at Pinjarra
|
|
|
1997 |
10 |
4 |
p. 8- 1 p. |
artikel |
30 |
SiGe microsystems: world's first merchant SiGe epiwafer supplier
|
Szweda, Roy |
|
1997 |
10 |
4 |
p. 29-30 2 p. |
artikel |
31 |
SOITEC to make wafers in France
|
|
|
1997 |
10 |
4 |
p. 10- 1 p. |
artikel |
32 |
Technique allows characterization of unknown alloys
|
|
|
1997 |
10 |
4 |
p. 4- 1 p. |
artikel |
33 |
The lifeblood of our industry
|
Finch, David |
|
1997 |
10 |
4 |
p. 2- 1 p. |
artikel |
34 |
The MOVPE community meets in Berlin
|
Resch-Esser, U. |
|
1997 |
10 |
4 |
p. 34-37 4 p. |
artikel |
35 |
Topcon offers fast, easy feature location
|
|
|
1997 |
10 |
4 |
p. 50- 1 p. |
artikel |
36 |
Veeco-Edwards pact
|
|
|
1997 |
10 |
4 |
p. 4- 1 p. |
artikel |