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                             17 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Automatic identification of different types of welding defects in radiographic images Wang, Gang
2002
35 8 p. 519-528
10 p.
artikel
2 Calendar 2002
35 8 p. 627-
1 p.
artikel
3 Comparison between thermographic techniques for frescoes NDT Carlomagno, Giovanni M.
2002
35 8 p. 559-565
7 p.
artikel
4 Comparison of NDT techniques on a post-tensioned beam before its autopsy Dérobert, X
2002
35 8 p. 541-548
8 p.
artikel
5 Computed tomographic images of soft materials using differential attenuation: interior properties of the materials at optimum energy in terms of attenuation coefficient Rao, D.V.
2002
35 8 p. 573-580
8 p.
artikel
6 Determination of elastic parameters in isotropic plates by using acoustic microscopy measurements and an optimization method Lematre, M.
2002
35 8 p. 493-502
10 p.
artikel
7 Generalized neural network approach to eddy current inversion for real cracks Yusa, Noritaka
2002
35 8 p. 609-614
6 p.
artikel
8 Index for Volume 35 (2002) 2002
35 8 p. I-V
nvt p.
artikel
9 Monte-Carlo simulation of industrial radiography images and experimental designs Bonin, A
2002
35 8 p. 503-510
8 p.
artikel
10 Mössbauer spectroscopy used for testing of reactor steels Slugen, V
2002
35 8 p. 511-518
8 p.
artikel
11 Online access for everyone via ScienceDirect Eastbury, Dean
2002
35 8 p. 491-492
2 p.
artikel
12 Parametric study on the impact-echo method using mock-up shafts Kim, D.S
2002
35 8 p. 595-608
14 p.
artikel
13 SAR interferometry for detecting the effects of earthquakes on buildings Pieraccini, Massimiliano
2002
35 8 p. 615-625
11 p.
artikel
14 Scattering and its role in radiography simulations Inanc, Feyzi
2002
35 8 p. 581-593
13 p.
artikel
15 The transmission of acoustic emission across large-scale turbine rotors Mba, D
2002
35 8 p. 529-539
11 p.
artikel
16 Time frequency and wavelet transform applied to selected problems in ultrasonics NDE Drai, Redouane
2002
35 8 p. 567-572
6 p.
artikel
17 Wavelet analysis based deconvolution to improve the resolution of scanning acoustic microscope images for the inspection of thin die layer in semiconductor Jhang, Kyungyoung
2002
35 8 p. 549-557
9 p.
artikel
                             17 gevonden resultaten
 
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